Influence of the film microstructure on the electronic properties and flicker noise in organic thin film transistors

Oana D. Jurchescu, Behrang H. Hamadani, Hao Xiong, Sungkyu K. Park, Sankar Subramanian, Neil M. Zimmerman, John Anthony, Thomas N. Jackson, David J. Gundlach

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

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Material Science