Abstract
The critical design parameters using synthetic images which shows scene information is studied to provide a valuable tool to evaluate algorithm performance. This leads to a better understanding of the magnitude and type of errors incurred. Numerical simulations of image capture differentiate and report minute changes in design factors more accurately than a physical prototype. Results suggest that synthetic images can be used to investigate the effect of design factors on the performance of image processing algorithms. While the synthetic images do not fully emulate the real manufacturing environment, they sufficiently predict captured image intensity value and the effects of small variations in major design parameters are easily investigated.
Original language | English |
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Pages | 136 |
Number of pages | 1 |
State | Published - 1997 |
Event | Proceedings of the 1997 1st IEEE/ASME International Conference on Advanced Intelligent Mechatronics, AIM'97 - Tokyo, Jpn Duration: Jun 16 1997 → Jun 20 1997 |
Conference
Conference | Proceedings of the 1997 1st IEEE/ASME International Conference on Advanced Intelligent Mechatronics, AIM'97 |
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City | Tokyo, Jpn |
Period | 6/16/97 → 6/20/97 |
ASJC Scopus subject areas
- General Engineering