M-Type Cathode Characterization Using a Kelvin Probe System in Vacuum Chamber

Antonio M. Mantica; Michael J. Detisch; T. John Balk

doi:10.1109/IVEC53421.2022.10292325

M-Type Cathode Characterization Using a Kelvin Probe System in Vacuum Chamber

Antonio M. Mantica, Michael J. Detisch, T. John Balk

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

High-performing dispenser cathodes are an essential component of modern vacuum electron devices (VEDs). Therefore, it is important to quantify their emission performance. In order to assess how well a cathode emits electrons, it is useful to measure the emitting surface's work function, or the energy input required to liberate an electron from the material. A lower work function is desirable because it should facilitate higher emitted current densities and longer service lifetimes. This work presents both emission data and work function measurements collected using a customized Kelvin Probe System (KPS) and one of the most common types of cathodes, the M-type cathode.

Original language	English
Title of host publication	2022 23rd International Vacuum Electronics Conference, IVEC 2022
Pages	95-96
Number of pages	2
ISBN (Electronic)	9781665443258
DOIs	https://doi.org/10.1109/IVEC53421.2022.10292325
State	Published - 2022
Event	23rd International Vacuum Electronics Conference, IVEC 2022 - Monterey, United States Duration: Apr 25 2022 → Apr 29 2022

Publication series

Name	2022 23rd International Vacuum Electronics Conference, IVEC 2022

Conference

Conference	23rd International Vacuum Electronics Conference, IVEC 2022
Country/Territory	United States
City	Monterey
Period	4/25/22 → 4/29/22

Bibliographical note

Publisher Copyright:
© 2022 IEEE.

Keywords

Kelvin probe
M-type cathode
thermionic emission
work function

ASJC Scopus subject areas

Atomic and Molecular Physics, and Optics
Electrical and Electronic Engineering
Instrumentation

Access to Document

10.1109/IVEC53421.2022.10292325

Cite this

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title = "M-Type Cathode Characterization Using a Kelvin Probe System in Vacuum Chamber",

abstract = "High-performing dispenser cathodes are an essential component of modern vacuum electron devices (VEDs). Therefore, it is important to quantify their emission performance. In order to assess how well a cathode emits electrons, it is useful to measure the emitting surface's work function, or the energy input required to liberate an electron from the material. A lower work function is desirable because it should facilitate higher emitted current densities and longer service lifetimes. This work presents both emission data and work function measurements collected using a customized Kelvin Probe System (KPS) and one of the most common types of cathodes, the M-type cathode.",

keywords = "Kelvin probe, M-type cathode, thermionic emission, work function",

author = "Mantica, {Antonio M.} and Detisch, {Michael J.} and Balk, {T. John}",

note = "Publisher Copyright: {\textcopyright} 2022 IEEE.; 23rd International Vacuum Electronics Conference, IVEC 2022 ; Conference date: 25-04-2022 Through 29-04-2022",

year = "2022",

doi = "10.1109/IVEC53421.2022.10292325",

language = "English",

series = "2022 23rd International Vacuum Electronics Conference, IVEC 2022",

pages = "95--96",

booktitle = "2022 23rd International Vacuum Electronics Conference, IVEC 2022",

}

Mantica, AM, Detisch, MJ & Balk, TJ 2022, M-Type Cathode Characterization Using a Kelvin Probe System in Vacuum Chamber. in 2022 23rd International Vacuum Electronics Conference, IVEC 2022. 2022 23rd International Vacuum Electronics Conference, IVEC 2022, pp. 95-96, 23rd International Vacuum Electronics Conference, IVEC 2022, Monterey, United States, 4/25/22. https://doi.org/10.1109/IVEC53421.2022.10292325

M-Type Cathode Characterization Using a Kelvin Probe System in Vacuum Chamber. / Mantica, Antonio M.; Detisch, Michael J.; Balk, T. John.
2022 23rd International Vacuum Electronics Conference, IVEC 2022. 2022. p. 95-96 (2022 23rd International Vacuum Electronics Conference, IVEC 2022).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - M-Type Cathode Characterization Using a Kelvin Probe System in Vacuum Chamber

AU - Mantica, Antonio M.

AU - Detisch, Michael J.

AU - Balk, T. John

PY - 2022

Y1 - 2022

N2 - High-performing dispenser cathodes are an essential component of modern vacuum electron devices (VEDs). Therefore, it is important to quantify their emission performance. In order to assess how well a cathode emits electrons, it is useful to measure the emitting surface's work function, or the energy input required to liberate an electron from the material. A lower work function is desirable because it should facilitate higher emitted current densities and longer service lifetimes. This work presents both emission data and work function measurements collected using a customized Kelvin Probe System (KPS) and one of the most common types of cathodes, the M-type cathode.

AB - High-performing dispenser cathodes are an essential component of modern vacuum electron devices (VEDs). Therefore, it is important to quantify their emission performance. In order to assess how well a cathode emits electrons, it is useful to measure the emitting surface's work function, or the energy input required to liberate an electron from the material. A lower work function is desirable because it should facilitate higher emitted current densities and longer service lifetimes. This work presents both emission data and work function measurements collected using a customized Kelvin Probe System (KPS) and one of the most common types of cathodes, the M-type cathode.

KW - Kelvin probe

KW - M-type cathode

KW - thermionic emission

KW - work function

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M3 - Conference contribution

AN - SCOPUS:85178513650

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SP - 95

EP - 96

BT - 2022 23rd International Vacuum Electronics Conference, IVEC 2022

T2 - 23rd International Vacuum Electronics Conference, IVEC 2022

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M-Type Cathode Characterization Using a Kelvin Probe System in Vacuum Chamber

Abstract

Publication series

Conference

Bibliographical note

Keywords

ASJC Scopus subject areas

Access to Document

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Cite this