Materials characterization of surface phases in scandate cathodes

T. John Balk; Xiaotao Liu; Qunfei Zhou; Tyler Maxwell; Matthew J. Beck; Bernard Vancil

doi:10.1109/IVEC.2018.8391510

Materials characterization of surface phases in scandate cathodes

T. John Balk, Xiaotao Liu, Qunfei Zhou, Tyler Maxwell, Matthew J. Beck, Bernard Vancil

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

2 Scopus citations

Abstract

Electron-transparent lamellae were extracted from a pair of scandate cathodes, each one made from L-S or L-L powders, and then examined using transmission electron microscopy (TEM). A distribution of chemically distinct phases appeared on the surface of tungsten grains, as well as inside them. While Ba and Al coexist in the same oxide particles, Sc exists separately in its own oxide phase. No evidence was found for the presence of a semiconducting layer containing both Ba and Sc, although it was specifically sought.

Original language	English
Title of host publication	2018 IEEE International Vacuum Electronics Conference, IVEC 2018
Pages	329-330
Number of pages	2
ISBN (Electronic)	9781538604540
DOIs	https://doi.org/10.1109/IVEC.2018.8391510
State	Published - Jun 20 2018
Event	19th IEEE International Vacuum Electronics Conference, IVEC 2018 - Monterey, United States Duration: Apr 23 2018 → Apr 26 2018

Publication series

Name	2018 IEEE International Vacuum Electronics Conference, IVEC 2018

Conference

Conference	19th IEEE International Vacuum Electronics Conference, IVEC 2018
Country/Territory	United States
City	Monterey
Period	4/23/18 → 4/26/18

Bibliographical note

Publisher Copyright:
© 2018 IEEE.

Keywords

scandate cathode
semiconducting layer
semiconductor model

ASJC Scopus subject areas

Electrical and Electronic Engineering
Instrumentation

Access to Document

10.1109/IVEC.2018.8391510

Cite this

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title = "Materials characterization of surface phases in scandate cathodes",

abstract = "Electron-transparent lamellae were extracted from a pair of scandate cathodes, each one made from L-S or L-L powders, and then examined using transmission electron microscopy (TEM). A distribution of chemically distinct phases appeared on the surface of tungsten grains, as well as inside them. While Ba and Al coexist in the same oxide particles, Sc exists separately in its own oxide phase. No evidence was found for the presence of a semiconducting layer containing both Ba and Sc, although it was specifically sought.",

keywords = "scandate cathode, semiconducting layer, semiconductor model",

author = "{John Balk}, T. and Xiaotao Liu and Qunfei Zhou and Tyler Maxwell and Beck, {Matthew J.} and Bernard Vancil",

note = "Publisher Copyright: {\textcopyright} 2018 IEEE.; 19th IEEE International Vacuum Electronics Conference, IVEC 2018 ; Conference date: 23-04-2018 Through 26-04-2018",

year = "2018",

month = jun,

day = "20",

doi = "10.1109/IVEC.2018.8391510",

language = "English",

series = "2018 IEEE International Vacuum Electronics Conference, IVEC 2018",

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}

John Balk, T, Liu, X, Zhou, Q, Maxwell, T, Beck, MJ & Vancil, B 2018, Materials characterization of surface phases in scandate cathodes. in 2018 IEEE International Vacuum Electronics Conference, IVEC 2018. 2018 IEEE International Vacuum Electronics Conference, IVEC 2018, pp. 329-330, 19th IEEE International Vacuum Electronics Conference, IVEC 2018, Monterey, United States, 4/23/18. https://doi.org/10.1109/IVEC.2018.8391510

Materials characterization of surface phases in scandate cathodes. / John Balk, T.; Liu, Xiaotao; Zhou, Qunfei et al.
2018 IEEE International Vacuum Electronics Conference, IVEC 2018. 2018. p. 329-330 (2018 IEEE International Vacuum Electronics Conference, IVEC 2018).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Materials characterization of surface phases in scandate cathodes

AU - John Balk, T.

AU - Liu, Xiaotao

AU - Zhou, Qunfei

AU - Maxwell, Tyler

AU - Beck, Matthew J.

AU - Vancil, Bernard

PY - 2018/6/20

Y1 - 2018/6/20

N2 - Electron-transparent lamellae were extracted from a pair of scandate cathodes, each one made from L-S or L-L powders, and then examined using transmission electron microscopy (TEM). A distribution of chemically distinct phases appeared on the surface of tungsten grains, as well as inside them. While Ba and Al coexist in the same oxide particles, Sc exists separately in its own oxide phase. No evidence was found for the presence of a semiconducting layer containing both Ba and Sc, although it was specifically sought.

AB - Electron-transparent lamellae were extracted from a pair of scandate cathodes, each one made from L-S or L-L powders, and then examined using transmission electron microscopy (TEM). A distribution of chemically distinct phases appeared on the surface of tungsten grains, as well as inside them. While Ba and Al coexist in the same oxide particles, Sc exists separately in its own oxide phase. No evidence was found for the presence of a semiconducting layer containing both Ba and Sc, although it was specifically sought.

KW - scandate cathode

KW - semiconducting layer

KW - semiconductor model

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T3 - 2018 IEEE International Vacuum Electronics Conference, IVEC 2018

SP - 329

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BT - 2018 IEEE International Vacuum Electronics Conference, IVEC 2018

T2 - 19th IEEE International Vacuum Electronics Conference, IVEC 2018

Y2 - 23 April 2018 through 26 April 2018

ER -

Materials characterization of surface phases in scandate cathodes

Abstract

Publication series

Conference

Bibliographical note

Keywords

ASJC Scopus subject areas

Access to Document

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