TY - GEN
T1 - Measurement of in-plane motion of thin-film structures using videogrammetry
AU - Leifer, Jack
AU - Smith, Suzanne Weaver
AU - Black, Jonathan T.
AU - Ma, Ning
AU - Lumpp, Janet K.
PY - 2006
Y1 - 2006
N2 - An electrodynamic shaker was used to apply a 1 Hz, 1.5 mm in-plane harmonic excitation to a thin-film "gossamer" material mounted in a rigid aluminum fixture. Using a two-camera videogrammetric setup that imaged the test article at a frequency of 75 Hz, the x,y, and z motion components of two points on the thin film (F1 and F2) as well as two points on the aluminum holder (R1 and R2) were tracked for a total of 4 seconds. The in-plane motion components of each tracked point closely corresponded to the excitation provided by the shaker. The presence of modality-induced in-plane film deformation was confirmed by tracking the change in distance between points F1 and F2. The standard deviation for the measured distances between these two points was found to be about 57 μm. This value was well above the noise floor for this measurement, 10 μm, which was experimentally determined by calculating the standard deviation of the measured distance between points R1 and R2 on the aluminum film holder, which did not undergo deformation.
AB - An electrodynamic shaker was used to apply a 1 Hz, 1.5 mm in-plane harmonic excitation to a thin-film "gossamer" material mounted in a rigid aluminum fixture. Using a two-camera videogrammetric setup that imaged the test article at a frequency of 75 Hz, the x,y, and z motion components of two points on the thin film (F1 and F2) as well as two points on the aluminum holder (R1 and R2) were tracked for a total of 4 seconds. The in-plane motion components of each tracked point closely corresponded to the excitation provided by the shaker. The presence of modality-induced in-plane film deformation was confirmed by tracking the change in distance between points F1 and F2. The standard deviation for the measured distances between these two points was found to be about 57 μm. This value was well above the noise floor for this measurement, 10 μm, which was experimentally determined by calculating the standard deviation of the measured distance between points R1 and R2 on the aluminum film holder, which did not undergo deformation.
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M3 - Conference contribution
AN - SCOPUS:34147126478
SN - 1563478080
SN - 9781563478086
T3 - Collection of Technical Papers - AIAA/ASME/ASCE/AHS/ASC Structures, Structural Dynamics and Materials Conference
SP - 2565
EP - 2580
BT - Collection of Technical Papers - 47th AIAA/ASME/ASCE/AHS/ASC Structures, Structural Dynamics and Materials Conference
T2 - 47th AIAA/ASME/ASCE/AHS/ASC Structures, Structural Dynamics and Materials Conference
Y2 - 1 May 2006 through 4 May 2006
ER -