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Measuring FRET efficiency with phase lifetime

  • Daniel Sumetsky
  • , James Y. Jiang
  • , Marina Ayad
  • , Timothy Mahon
  • , Audrey Menaesse
  • , Marina M. Cararo-Lopes
  • , Mihir V. Patel
  • , Bonnie L. Firestein
  • , Nada N. Boustany

Research output: Contribution to journalConference articlepeer-review

Abstract

A linear relationship between apparent EFRET app, based on phase lifetime, and EFRET true, based on sensitized emission, holds for modulation frequencies such that 1.1 and simplifies data acquisition and interpretation in FLIM-FRET.

Original languageEnglish
Article numberMTu4A.4
JournalOptics InfoBase Conference Papers
StatePublished - 2022
EventMicroscopy Histopathology and Analytics, Microscopy 2022 - Fort Lauderdale, United States
Duration: Apr 24 2022Apr 27 2022

Bibliographical note

Publisher Copyright:
© 2022 The Author(s).

Funding

Acknowledgements: This study was supported by a NSF GOALI grant under award CMMI-1825433 to N.N.B and B.L.F. M.C.C. was supported by a Predoctoral Fellowship from CAPES, and M.P. was supported by NJCBIR Predoctoral Fellowship #CBIR15FEL009.

FundersFunder number
National Science FoundationCMMI-1825433
New Jersey Commission on Brain Injury Research15FEL009
Coordenação de Aperfeiçoamento de Pessoal de Nível Superior

    ASJC Scopus subject areas

    • Electronic, Optical and Magnetic Materials
    • Mechanics of Materials

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