@inproceedings{4d93b778482044ae9da41b2f0f4f99ec,
title = "Microstructural influence of OsRu thin films on dispenser cathodes",
abstract = "Osmium-Ruthenium films were subjected to 1000 hours of close-spaced diode (CSD) testing and the film microstructures were evaluated in light of the CSD test results in order to generate improved film architectures for further CSD testing. Low knee temperatures correlated with a {10-10}/{10-11} film texture of annealed films.",
keywords = "M-coating, M-type, dispenser cathode, microstructure, osmium, ruthenium, thin film",
author = "Phillip Swartzentruber and Balk, {T. John} and Scott Roberts and Michael Effgen",
year = "2012",
doi = "10.1109/IVEC.2012.6262116",
language = "English",
isbn = "9781467301879",
series = "2012 IEEE 13th International Vacuum Electronics Conference, IVEC 2012",
pages = "163--164",
booktitle = "2012 IEEE 13th International Vacuum Electronics Conference, IVEC 2012",
note = "2012 IEEE 13th International Vacuum Electronics Conference, IVEC 2012 ; Conference date: 24-04-2012 Through 26-04-2012",
}