Abstract
Modeling the electric potential profile above the lunar surface is critical for understanding surface charging and interactions with the space environment. Traditional methods like Particle-in-Cell (PIC) simulations are highly accurate but computationally expensive. To address this, we propose a hybrid approach using a Multi-Layer Perceptron (MLP) architecture in both data-driven neural networks and Physics-Informed Neural Networks (PINNs). The PINN component incorporates physical laws directly into the training process, ensuring physical consistency, while the data-driven component captures complex patterns. This combination offers a significant reduction in computational cost compared to PIC methods while maintaining high modeling accuracy. Our results show that the proposed method effectively represents the electric potential profile above the lunar surface, even with limited data.
Original language | English |
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Title of host publication | Proceedings - 2024 IEEE International Conference on Big Data, BigData 2024 |
Editors | Wei Ding, Chang-Tien Lu, Fusheng Wang, Liping Di, Kesheng Wu, Jun Huan, Raghu Nambiar, Jundong Li, Filip Ilievski, Ricardo Baeza-Yates, Xiaohua Hu |
Pages | 4269-4274 |
Number of pages | 6 |
ISBN (Electronic) | 9798350362480 |
DOIs | |
State | Published - 2024 |
Event | 2024 IEEE International Conference on Big Data, BigData 2024 - Washington, United States Duration: Dec 15 2024 → Dec 18 2024 |
Publication series
Name | Proceedings - 2024 IEEE International Conference on Big Data, BigData 2024 |
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Conference
Conference | 2024 IEEE International Conference on Big Data, BigData 2024 |
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Country/Territory | United States |
City | Washington |
Period | 12/15/24 → 12/18/24 |
Bibliographical note
Publisher Copyright:© 2024 IEEE.
Keywords
- electric potential profile
- Lunar Surface Charging
- Physics-Informed Neural Network
ASJC Scopus subject areas
- Artificial Intelligence
- Computer Networks and Communications
- Computer Science Applications
- Information Systems
- Information Systems and Management
- Safety, Risk, Reliability and Quality
- Modeling and Simulation