Morphological instability of elastic thin films-effect of electromechanical interaction

Fuqian Yang, Wei Song

Research output: Contribution to journalArticlepeer-review

15 Scopus citations

Abstract

We examine surface evolution of a stressed elastic conducting thin film in an electric field. A dispersion relation describing morphological evolution of the film is derived by using the theory of linear perturbation. The growth behavior of surface perturbations depends on surface energy, elastic energy, electric energy and electromechanical interaction. Under certain conditions, electric field can suppress surface instability. For surface perturbations of large spatial wavelength, the critical frequency is inversely proportional to the square root of the surface energy of the thin film.

Original languageEnglish
Article number111912
JournalApplied Physics Letters
Volume87
Issue number11
DOIs
StatePublished - Sep 12 2005

Bibliographical note

Funding Information:
F.Y. is grateful for support from NSF grant CMS-0508989

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Fingerprint

Dive into the research topics of 'Morphological instability of elastic thin films-effect of electromechanical interaction'. Together they form a unique fingerprint.

Cite this