We examine surface evolution of a stressed elastic conducting thin film in an electric field. A dispersion relation describing morphological evolution of the film is derived by using the theory of linear perturbation. The growth behavior of surface perturbations depends on surface energy, elastic energy, electric energy and electromechanical interaction. Under certain conditions, electric field can suppress surface instability. For surface perturbations of large spatial wavelength, the critical frequency is inversely proportional to the square root of the surface energy of the thin film.
|Applied Physics Letters
|Published - Sep 12 2005
Bibliographical noteFunding Information:
F.Y. is grateful for support from NSF grant CMS-0508989
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)