Skip to main navigation Skip to search Skip to main content

Multi-level metal CMOS manufacturing with deuterium for improved hot carrier reliability

  • I. C. Kizilyalli
  • , G. Weber
  • , Z. Chen
  • , G. Abeln
  • , M. Schofield
  • , B. Kotzias
  • , F. Register
  • , E. Harris
  • , S. Sen
  • , S. Chetlur
  • , M. Patel
  • , L. Stirling
  • , R. Huang
  • , A. Massengale
  • , P. K. Roy

Research output: Contribution to journalConference articlepeer-review

8 Scopus citations

Fingerprint

Dive into the research topics of 'Multi-level metal CMOS manufacturing with deuterium for improved hot carrier reliability'. Together they form a unique fingerprint.
Sort by

Engineering