TY - GEN
T1 - Multicamera phase measuring profilometry for accurate depth measurement
AU - Wang, Yongchang
AU - Liu, Kai
AU - Hao, Qi
AU - Lau, Daniel
AU - Hassebrook, Laurence G.
PY - 2007
Y1 - 2007
N2 - Structured light illumination refers to a scanning process of projecting a series of patterns such that, when viewed from an angle, a camera is able to extract range information. Ultimately, resolution in depth is controlled by the number of patterns projected which, in turn, increases the total time that the target object must remain still. By adding a second camera sensor, it becomes possible to not only achieve wrap around scanning but also reduce the number of patterns needed to achieve a certain degree of depth resolution. But a second camera also makes it possible to reconstruct 3-D surfaces through stereo-vision techniques and triangulation between the cameras instead of between the cameras and the projectors. For both of these two tasks, correspondence between points from two cameras is essential. In this paper, we develop a new method to find the correspondence between the two cameras using both the phase information generated by the temporal multiplexed illumination patterns and stereo triangulation. We also analyze the resulting correspondence accuracy as a function of the number of structured patterns as well as the geometric position of projector to cameras.
AB - Structured light illumination refers to a scanning process of projecting a series of patterns such that, when viewed from an angle, a camera is able to extract range information. Ultimately, resolution in depth is controlled by the number of patterns projected which, in turn, increases the total time that the target object must remain still. By adding a second camera sensor, it becomes possible to not only achieve wrap around scanning but also reduce the number of patterns needed to achieve a certain degree of depth resolution. But a second camera also makes it possible to reconstruct 3-D surfaces through stereo-vision techniques and triangulation between the cameras instead of between the cameras and the projectors. For both of these two tasks, correspondence between points from two cameras is essential. In this paper, we develop a new method to find the correspondence between the two cameras using both the phase information generated by the temporal multiplexed illumination patterns and stereo triangulation. We also analyze the resulting correspondence accuracy as a function of the number of structured patterns as well as the geometric position of projector to cameras.
KW - Correspondence
KW - Phase measuring profilometry
KW - Stereo phase matching
KW - Structured light illumination
KW - Sub-pixel
UR - http://www.scopus.com/inward/record.url?scp=35948940089&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=35948940089&partnerID=8YFLogxK
U2 - 10.1117/12.720068
DO - 10.1117/12.720068
M3 - Conference contribution
AN - SCOPUS:35948940089
SN - 0819466778
SN - 9780819466778
T3 - Proceedings of SPIE - The International Society for Optical Engineering
BT - Sensors and Systems for Space Applications
T2 - Sensors and Systems for Space Applications
Y2 - 9 April 2007 through 11 April 2007
ER -