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Nanometer-Thick Sr2IrO4Freestanding Films for Flexible Electronics

  • Sujan Shrestha
  • , Matthew Coile
  • , Menglin Zhu
  • , Maryam Souri
  • , Jiwoong Kim
  • , Rina Pandey
  • , Joseph W. Brill
  • , Jinwoo Hwang
  • , Jong Woo Kim
  • , Ambrose Seo

Research output: Contribution to journalArticlepeer-review

14 Scopus citations

Abstract

We report the structural and optical properties of nanoscale Sr2IrO4 freestanding thin films fabricated using a water-soluble Sr3Al2O6 layer. The coherent lattice structure, phonon modes, two-magnon Raman scattering, and optical absorption spectra of the Sr2IrO4 nanomembrane are analogous to those of the layered iridate epitaxial thin films and single crystals. Remarkably, the formation of 3-unit-cell-thick SrIrO3 and interfacial composite layers alleviates the antiphase boundaries at the Sr2IrO4/Sr3Al2O6 interface, resulting in structurally robust nanomembranes. Our experimental results show that this freestanding thin-film approach of layered oxides can provide techniques for tuning or realizing unprecedented states beyond conventional thin-film methods, suggesting a pathway in achieving flexible layered-oxide electronics.

Original languageEnglish
Pages (from-to)6310-6315
Number of pages6
JournalACS Applied Nano Materials
Volume3
Issue number7
DOIs
StatePublished - Jul 24 2020

Bibliographical note

Publisher Copyright:
Copyright © 2020 American Chemical Society.

Funding

We acknowledge the support of a National Science Foundation (NSF) Grant No. DMR-1454200 for thin-film synthesis and characterization. M.Z. and J.H. acknowledge support by NSF, under Grant No. DMR-1847964. Electron microscopy was performed at the Center for Electron Microscopy and Analysis at The Ohio State University. This research used resources of the Advanced Photon Source, a U.S. Department of Energy (DOE) Office of Science User Facility operated for the DOE Office of Science by Argonne National Laboratory under Contract No. DE-AC02-06CH11357. A.S. acknowledges the support from the Alexander von Humboldt Foundation (Research Fellowship for Experienced Researchers) for Raman spectroscopy experiments.

FundersFunder number
U.S. Department of Energy EPSCoR
Office of Science Programs
Alexander von Humboldt-Stiftung
National Science Foundation Arctic Social Science ProgramDMR-1847964, 1847964, DMR-1454200
Argonne National LaboratoryDE-AC02-06CH11357

    Keywords

    • STEM
    • SrIrO
    • freestanding thin films
    • interface
    • layered oxides
    • strain

    ASJC Scopus subject areas

    • General Materials Science

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