Nanoscale elastic strain mapping of polycrystalline materials

Paul F. Rottmann, Kevin J. Hemker

Research output: Contribution to journalArticlepeer-review

24 Scopus citations


Measuring elastic strain with nanoscale resolution has historically been very difficult and required a marriage of simulations and experiments. Nano precession electron diffraction provides excellent strain and spatial resolution but has traditionally only been applied to single-crystalline semiconductors. The present study illustrates that the technique can also be applied to polycrystalline materials. The ±2σ strain resolution was determined to be 0.15% and 0.10% for polycrystalline copper and boron carbide, respectively. Local strain maps were obtained near grain boundaries in boron carbide and dislocations in magnesium and shown to correlate with expected values, thus demonstrating the efficacy of this technique.(Image presented) IMPACT STATEMENT This study demonstrates that nano precession electron diffraction can be extended from semiconductor devices to polycrystalline metals and ceramics to map nanoscale elastic strain fields with high strain resolution.

Original languageEnglish
Pages (from-to)249-254
Number of pages6
JournalMaterials Research Letters
Issue number4
StatePublished - Apr 3 2018

Bibliographical note

Publisher Copyright:
© 2018 The Author(s). Published by Informa UK Limited, trading as Taylor & Francis Group.


  • Nanobeam electron diffraction
  • Strain measurement
  • Transmission electron microscopy

ASJC Scopus subject areas

  • General Materials Science


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