Nanoscale wear and machining behavior of nanolayer interfaces

Xueyuan Nie; Peng Zhang; Anita M. Weiner; Yang Tse Cheng

doi:10.1021/nl051460z

Nanoscale wear and machining behavior of nanolayer interfaces

Xueyuan Nie, Peng Zhang, Anita M. Weiner, Yang Tse Cheng

Research output: Contribution to journal › Article › peer-review

33 Scopus citations

Abstract

An atomic force microscope was used to subnanometer incise a nanomultilayer to consequently expose individual nanolayers and interfaces on which sliding and scanning nanowear/machining have been performed. The letter reports the first observation on the nanoscale where (i) atomic debris forms in a collective manner, most-likely by deformation and rupture of atomic bonds, and (ii) the nanolayer interfaces possess a much higher wear resistance (desired for nanomachines) or lower machinability (not desired for nanomachining) than the layers.

Original language	English
Pages (from-to)	1992-1996
Number of pages	5
Journal	Nano Letters
Volume	5
Issue number	10
DOIs	https://doi.org/10.1021/nl051460z
State	Published - Oct 2005

ASJC Scopus subject areas

Bioengineering
General Chemistry
General Materials Science
Condensed Matter Physics
Mechanical Engineering

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abstract = "An atomic force microscope was used to subnanometer incise a nanomultilayer to consequently expose individual nanolayers and interfaces on which sliding and scanning nanowear/machining have been performed. The letter reports the first observation on the nanoscale where (i) atomic debris forms in a collective manner, most-likely by deformation and rupture of atomic bonds, and (ii) the nanolayer interfaces possess a much higher wear resistance (desired for nanomachines) or lower machinability (not desired for nanomachining) than the layers.",

author = "Xueyuan Nie and Peng Zhang and Weiner, {Anita M.} and Cheng, {Yang Tse}",

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AU - Nie, Xueyuan

AU - Zhang, Peng

AU - Weiner, Anita M.

AU - Cheng, Yang Tse

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Y1 - 2005/10

N2 - An atomic force microscope was used to subnanometer incise a nanomultilayer to consequently expose individual nanolayers and interfaces on which sliding and scanning nanowear/machining have been performed. The letter reports the first observation on the nanoscale where (i) atomic debris forms in a collective manner, most-likely by deformation and rupture of atomic bonds, and (ii) the nanolayer interfaces possess a much higher wear resistance (desired for nanomachines) or lower machinability (not desired for nanomachining) than the layers.

AB - An atomic force microscope was used to subnanometer incise a nanomultilayer to consequently expose individual nanolayers and interfaces on which sliding and scanning nanowear/machining have been performed. The letter reports the first observation on the nanoscale where (i) atomic debris forms in a collective manner, most-likely by deformation and rupture of atomic bonds, and (ii) the nanolayer interfaces possess a much higher wear resistance (desired for nanomachines) or lower machinability (not desired for nanomachining) than the layers.

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SP - 1992

EP - 1996

JO - Nano Letters

JF - Nano Letters

IS - 10

ER -

Nanoscale wear and machining behavior of nanolayer interfaces

Abstract

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