Near-optimum adaptive tessellation of general catmull-clark subdivision surfaces

Shuhua Lai, Fuhua Cheng

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations


A new adaptive tessellation method for general Catmull-Clark subdivision surfaces is presented. Development of the new method is based on the observation that optimum adaptive tessellation for rendering purpose is a recursive error evaluation and globalization process. The adaptive tessellation process is done by generating an inscribing polyhedron to approximate the limit surface for each individual patch. The inscribing polyhedron is generated through an adaptive subdivision on the patch's parameter space driven by a recursive error evaluation process. This approach generates less faces in the resulting approximating mesh while meeting the given precision requirement. The crack problem is avoided through globalization of new vertices generated in the adaptive subdivision process of the parameter space. No crack-detection or crack-elimination is needed in the adaptive tessellation process. Therefore, no mesh element splitting to eliminate cracks is necessary. The new adaptive tessellation method can precisely measure the error for every point of the limit surface. Hence, it has complete control of the accuracy of the tessellation result.

Original languageEnglish
Title of host publicationAdvances in Computer Graphics - 24th Computer Graphics International Conference, CGI 2006
Number of pages8
StatePublished - 2006
Event24th Computer Graphics International Conference, CGI 2006 - Hangzhou, China
Duration: Jun 26 2006Jun 28 2006

Publication series

NameLecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
Volume4035 LNCS
ISSN (Print)0302-9743
ISSN (Electronic)1611-3349


Conference24th Computer Graphics International Conference, CGI 2006

ASJC Scopus subject areas

  • Theoretical Computer Science
  • Computer Science (all)


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