The detection of targets embedded in dense microstructure scatterers using ultrasonic pulse-echo systems is examined. Split-spectrum processing (SSP) is presented as an efficient method for discriminating between target echoes and microstructure scattering based on differences between their RF phase patterns. The design of constant false-alarm thresholds is described for the F-test applied to RF SSP vectors. Experimental results are presented for A-scans from large-grain stainless-steel samples with flat-bottom holes.
|Number of pages||5|
|Journal||Ultrasonics Symposium Proceedings|
|State||Published - 1990|
|Event||Proceedings of the IEEE 1990 Ultrasonics Symposium - Honolulu, HI, USA|
Duration: Dec 4 1990 → Dec 7 1990
ASJC Scopus subject areas
- Engineering (all)