Nonparametric flaw detection in large grained materials

N. M. Bilgutay, K. D. Donohue, X. Li

Research output: Contribution to journalConference articlepeer-review

1 Scopus citations

Abstract

The detection of targets embedded in dense microstructure scatterers using ultrasonic pulse-echo systems is examined. Split-spectrum processing (SSP) is presented as an efficient method for discriminating between target echoes and microstructure scattering based on differences between their RF phase patterns. The design of constant false-alarm thresholds is described for the F-test applied to RF SSP vectors. Experimental results are presented for A-scans from large-grain stainless-steel samples with flat-bottom holes.

Original languageEnglish
Pages (from-to)1137-1141
Number of pages5
JournalUltrasonics Symposium Proceedings
Volume2
StatePublished - 1990
EventProceedings of the IEEE 1990 Ultrasonics Symposium - Honolulu, HI, USA
Duration: Dec 4 1990Dec 7 1990

ASJC Scopus subject areas

  • Engineering (all)

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