Abstract
The detection of targets embedded in dense microstructure scatterers using ultrasonic pulse-echo systems is examined. Split-spectrum processing (SSP) is presented as an efficient method for discriminating between target echoes and microstructure scattering based on differences between their RF phase patterns. The design of constant false-alarm thresholds is described for the F-test applied to RF SSP vectors. Experimental results are presented for A-scans from large-grain stainless-steel samples with flat-bottom holes.
| Original language | English |
|---|---|
| Pages (from-to) | 1137-1141 |
| Number of pages | 5 |
| Journal | Ultrasonics Symposium Proceedings |
| Volume | 2 |
| State | Published - 1990 |
| Event | Proceedings of the IEEE 1990 Ultrasonics Symposium - Honolulu, HI, USA Duration: Dec 4 1990 → Dec 7 1990 |
ASJC Scopus subject areas
- General Engineering