Abstract
As the availability of geotagged imagery has increased, so has the interest in geolocation-related computer vision applications, ranging from wide-area image geolocalization to the extraction of environmental data from social network imagery. Encouraged by the recent success of deep convolutional networks for learning high-level features, we investigate the usefulness of deep learned features for such problems. We compare features extracted from various layers of convolutional neural networks and analyze their discriminative ability with regards to location. Our analysis spans several problem settings, including region identification, visualizing land cover in aerial imagery, and ground-image localization in regions without ground-image reference data (where we achieve state-of-the-art performance on a benchmark dataset). We present results on multiple datasets, including a new dataset we introduce containing hundreds of thousands of ground-level and aerial images in a large region centered around San Francisco.
Original language | English |
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Title of host publication | 2015 IEEE Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2015 |
Pages | 70-78 |
Number of pages | 9 |
ISBN (Electronic) | 9781467367592 |
DOIs | |
State | Published - Oct 19 2015 |
Event | IEEE Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2015 - Boston, United States Duration: Jun 7 2015 → Jun 12 2015 |
Publication series
Name | IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops |
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Volume | 2015-October |
ISSN (Print) | 2160-7508 |
ISSN (Electronic) | 2160-7516 |
Conference
Conference | IEEE Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2015 |
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Country/Territory | United States |
City | Boston |
Period | 6/7/15 → 6/12/15 |
Bibliographical note
Publisher Copyright:© 2015 IEEE.
Keywords
- Databases
- Feature extraction
- Geology
- Neural networks
- Principal component analysis
- Support vector machines
- Visualization
ASJC Scopus subject areas
- Computer Vision and Pattern Recognition
- Electrical and Electronic Engineering