PROFILE METERS FOR DETAILED MEASUREMENT OF SOIL SURFACE HEIGHTS.

M. C. Hirschi, B. J. Barfield, I. D. Moore, D. G. Colliver

Research output: Contribution to journalArticlepeer-review

11 Scopus citations

Abstract

Two surface profile meters were developed for use in soil erosion research. Both were designed for use on 4. 6 m wide field plots. Surface heights were measured electronically and stored on floppy disks. Meter pin spacing of 6. 4 cm and 1. 3 cm allowed measurement of plot characteristics and rill cross-sections. The accuracy of the meters was determined to be better than plus or minus 1 mm. Design criteria, circuitry, and performance data are presented.

Original languageEnglish
Pages (from-to)47-51
Number of pages5
JournalApplied Engineering in Agriculture
Volume3
Issue number1
StatePublished - May 1987

ASJC Scopus subject areas

  • Engineering (all)

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