Quantifying the work function of materials is a major component of research dedicated to developing in vacuo electrical devices with high current density at low operating temperatures. These devices are regularly composites of more than one material and understanding the roles that the individual components play in determining the overall work function is at the frontier of this research . The work function characterization technique outlined here is analysis using a Kelvin Probe System, which yields the opportunity to quantify a material's work function through measuring contact potential difference (CPD) or through surface photovoltage spectroscopy (SPS). In this paper, these separate techniques are outlined and experimental data is given for W and Ba, two elements of interest in device development.
|Title of host publication||2020 IEEE 21st International Conference on Vacuum Electronics, IVEC 2020|
|Number of pages||2|
|State||Published - Oct 19 2020|
|Event||21st IEEE International Conference on Vacuum Electronics, IVEC 2020 - Monterey, United States|
Duration: Oct 19 2020 → Oct 22 2020
|Name||2020 IEEE 21st International Conference on Vacuum Electronics, IVEC 2020|
|Conference||21st IEEE International Conference on Vacuum Electronics, IVEC 2020|
|Period||10/19/20 → 10/22/20|
Bibliographical noteFunding Information:
This work was financially supported by Engi-Mat LLC, USA, through Navy STTR contract N00253-17-C-0014.
© 2020 IEEE.
- Contact potential difference
- Kelvin probe
- Surface photovoltage spectroscopy
- Work function
ASJC Scopus subject areas
- Electrical and Electronic Engineering
- Electronic, Optical and Magnetic Materials