Abstract
Roadway free-flow speed captures the typical vehicle speed in low traffic conditions. Modeling free-flow speed is an important problem in transportation engineering with applications to a variety of design, operation, planning, and policy decisions of highway systems. Unfortunately, collecting large-scale historical traffic speed data is expensive and time consuming. Traditional approaches for estimating free-flow speed use geometric properties of the underlying road segment, such as grade, curvature, lane width, lateral clearance and access point density, but for many roads such features are unavailable. We propose a fully automated approach, RasterNet, for estimating free-flow speed without the need for explicit geometric features. RasterNet is a neural network that fuses large-scale overhead imagery and aerial LiDAR point clouds using a geospatially consistent raster structure. To support training and evaluation, we introduce a novel dataset combining free-flow speeds of road segments, overhead imagery, and LiDAR point clouds across the state of Kentucky. Our method achieves state-of-the-art results on a benchmark dataset.
Original language | English |
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Title of host publication | Proceedings - 2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2020 |
Pages | 826-834 |
Number of pages | 9 |
ISBN (Electronic) | 9781728193601 |
DOIs | |
State | Published - Jun 2020 |
Event | 2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2020 - Virtual, Online, United States Duration: Jun 14 2020 → Jun 19 2020 |
Publication series
Name | IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops |
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Volume | 2020-June |
ISSN (Print) | 2160-7508 |
ISSN (Electronic) | 2160-7516 |
Conference
Conference | 2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2020 |
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Country/Territory | United States |
City | Virtual, Online |
Period | 6/14/20 → 6/19/20 |
Bibliographical note
Publisher Copyright:© 2020 IEEE.
ASJC Scopus subject areas
- Computer Vision and Pattern Recognition
- Electrical and Electronic Engineering