Recoverable stress induced two-way shape memory effect on NiTi surface using laser-produced shock wave

Dovletgeldi Seyitliyev, Peizhen Li, Khomidkhodza Kholikov, Byron Grant, Zachary Thomas, Orhan Alal, Haluk E. Karaca, Ali O. Er

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review


The surfaces of Ni50Ti50 shape memory alloys (SMAs) were patterned by laser scribing. This method is more simplistic and efficient than traditional indentation techniques, and has also shown to be an effective method in patterning these materials. Different laser energy densities ranging from 5 mJ/pulse to 56 mJ/pulse were used to observe recovery on SMA surface. The temperature dependent heat profiles of the NiTi surfaces after laser scribing at 56 mJ/pulse show the partially-recovered indents, which indicate a "shape memory effect (SME)" Experimental data is in good agreement with theoretical simulation of laser induced shock wave propagation inside NiTi SMAs. Stress wave closely followed the rise time of the laser pulse to its peak values and initial decay. Further investigations are underway to improve the SME such that the indents are recovered to a greater extent.

Original languageEnglish
Title of host publicationLaser-Based Micro- and Nanoprocessing XI
EditorsUdo Klotzbach, Rainer Kling, Kunihiko Washio
ISBN (Electronic)9781510606258
StatePublished - 2017
EventLaser-Based Micro- and Nanoprocessing XI 2017 - San Francisco, United States
Duration: Jan 31 2017Feb 2 2017

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X


ConferenceLaser-Based Micro- and Nanoprocessing XI 2017
Country/TerritoryUnited States
CitySan Francisco

Bibliographical note

Publisher Copyright:
© 2017 SPIE.


  • direct laser ablation
  • laser-shockwave
  • recovery
  • shape memory

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering


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