Reflectivity and PDE of VUV4 Hamamatsu SiPMs in liquid xenon

P. Nakarmi; I. Ostrovskiy; A. K. Soma; F. Retière; S. Al Kharusi; M. Alfaris; G. Anton; I. J. Arnquist; I. Badhrees; P. S. Barbeau; D. Beck; V. Belov; T. Bhatta; J. Blatchford; P. A. Breur; J. P. Brodsky; E. Brown; T. Brunner; S. Byrne Mamahit; E. Caden; G. F. Cao; L. Cao; C. Chambers; B. Chana; S. A. Charlebois; M. Chiu; B. Cleveland; M. Coon; A. Craycraft; J. Dalmasson; T. Daniels; L. Darroch; A. De St Croix; A. Der Mesrobian-Kabakian; R. Devoe; M. L.Di Vacri; J. Dilling; Y. Y. Ding; M. J. Dolinski; L. Doria; A. Dragone; J. Echevers; F. Edaltafar; M. Elbeltagi; L. Fabris; D. Fairbank; W. Fairbank; J. Farine; S. Ferrara; S. Feyzbakhsh; R. Fontaine; A. Fucarino; G. Gallina; P. Gautam; G. Giacomini; D. Goeldi; R. Gornea; G. Gratta; E. V. Hansen; M. Heffner; E. W. Hoppe; J. Hößl; A. House; M. Hughes; A. Iverson; A. Jamil; M. J. Jewell; X. S. Jiang; A. Karelin; L. J. Kaufman; T. Koffas; R. Krücken; A. Kuchenkov; K. S. Kumar; Y. Lan; A. Larson; K. G. Leach; B. G. Lenardo; D. S. Leonard; G. Li; S. Li; Z. Li; C. Licciardi; P. Lv; R. Maclellan; N. Massacret; T. McElroy; M. Medina-Peregrina; T. Michel; B. Mong; D. C. Moore; K. Murray; C. R. Natzke; R. J. Newby; Z. Ning; O. Njoya; F. Nolet; O. Nusair; K. Odgers; A. Odian; M. Oriunno; J. L. Orrell; G. S. Ortega; C. T. Overman; S. Parent; A. Piepke; A. Pocar; J. F. Pratte; V. Radeka; E. Raguzin; S. Rescia; M. Richman; A. Robinson; T. Rossignol; P. C. Rowson; N. Roy; J. Runge; R. Saldanha; S. Sangiorgio; K. Skarpaas Viii; G. St-Hilaire; V. Stekhanov; T. Stiegler; X. L. Sun; M. Tarka; J. Todd; T. I. Totev; R. Tsang; T. Tsang; F. Vachon; V. Veeraraghavan; S. Viel; G. Visser; C. Vivo-Vilches; J. L. Vuilleumier; M. Wagenpfeil; T. Wager; M. Walent; Q. Wang; M. Ward; J. Watkins; M. Weber; W. Wei; L. J. Wen; U. Wichoski; S. X. Wu; W. H. Wu; X. Wu; Q. Xia; H. Yang; L. Yang; O. Zeldovich; J. Zhao; Y. Zhou; T. Ziegler

doi:10.1088/1748-0221/15/01/P01019

Reflectivity and PDE of VUV4 Hamamatsu SiPMs in liquid xenon

P. Nakarmi, I. Ostrovskiy, A. K. Soma, F. Retière, S. Al Kharusi, M. Alfaris, G. Anton, I. J. Arnquist, I. Badhrees, P. S. Barbeau, D. Beck, V. Belov, T. Bhatta, J. Blatchford, P. A. Breur, J. P. Brodsky, E. Brown, T. Brunner, S. Byrne Mamahit, E. CadenG. F. Cao, L. Cao, C. Chambers, B. Chana, S. A. Charlebois, M. Chiu, B. Cleveland, M. Coon, A. Craycraft, J. Dalmasson, T. Daniels, L. Darroch, A. De St Croix, A. Der Mesrobian-Kabakian, R. Devoe, M. L.Di Vacri, J. Dilling, Y. Y. Ding, M. J. Dolinski, L. Doria, A. Dragone, J. Echevers, F. Edaltafar, M. Elbeltagi, L. Fabris, D. Fairbank, W. Fairbank, J. Farine, S. Ferrara, S. Feyzbakhsh, R. Fontaine, A. Fucarino, G. Gallina, P. Gautam, G. Giacomini, D. Goeldi, R. Gornea, G. Gratta, E. V. Hansen, M. Heffner, E. W. Hoppe, J. Hößl, A. House, M. Hughes, A. Iverson, A. Jamil, M. J. Jewell, X. S. Jiang, A. Karelin, L. J. Kaufman, T. Koffas, R. Krücken, A. Kuchenkov, K. S. Kumar, Y. Lan, A. Larson, K. G. Leach, B. G. Lenardo, D. S. Leonard, G. Li, S. Li, Z. Li, C. Licciardi, P. Lv, R. Maclellan, N. Massacret, T. McElroy, M. Medina-Peregrina, T. Michel, B. Mong, D. C. Moore, K. Murray, C. R. Natzke, R. J. Newby, Z. Ning, O. Njoya, F. Nolet, O. Nusair, K. Odgers, A. Odian, M. Oriunno, J. L. Orrell, G. S. Ortega, C. T. Overman, S. Parent, A. Piepke, A. Pocar, J. F. Pratte, V. Radeka, E. Raguzin, S. Rescia, M. Richman, A. Robinson, T. Rossignol, P. C. Rowson, N. Roy, J. Runge, R. Saldanha, S. Sangiorgio, K. Skarpaas Viii, G. St-Hilaire, V. Stekhanov, T. Stiegler, X. L. Sun, M. Tarka, J. Todd, T. I. Totev, R. Tsang, T. Tsang, F. Vachon, V. Veeraraghavan, S. Viel, G. Visser, C. Vivo-Vilches, J. L. Vuilleumier, M. Wagenpfeil, T. Wager, M. Walent, Q. Wang, M. Ward, J. Watkins, M. Weber, W. Wei, L. J. Wen, U. Wichoski, S. X. Wu, W. H. Wu, X. Wu, Q. Xia, H. Yang, L. Yang, O. Zeldovich, J. Zhao, Y. Zhou, T. Ziegler

Center for Computational Sciences

Research output: Contribution to journal › Article › peer-review

12 Scopus citations

Abstract

Understanding reflective properties of materials and photodetection efficiency (PDE) of photodetectors is important for optimizing energy resolution and sensitivity of the next generation neutrinoless double beta decay, direct detection dark matter, and neutrino oscillation experiments that will use noble liquid gases, such as nEXO, DARWIN, DarkSide-20k, and DUNE . Little information is currently available about reflectivity and PDE in liquid noble gases, because such measurements are difficult to conduct in a cryogenic environment and at short enough wavelengths. Here we report a measurement of specular reflectivity and relative PDE of Hamamatsu VUV4 silicon photomultipliers (SiPMs) with 50 μm micro-cells conducted with xenon scintillation light (∼175 nm) in liquid xenon. The specular reflectivity at 15^&circ; incidence of three samples of VUV4 SiPMs is found to be 30.4±1.4%, 28.6±1.3%, and 28.0±1.3%, respectively. The PDE at normal incidence differs by ±8% (standard deviation) among the three devices. The angular dependence of the reflectivity and PDE was also measured for one of the SiPMs. Both the reflectivity and PDE decrease as the angle of incidence increases. This is the first measurement of an angular dependence of PDE and reflectivity of a SiPM in liquid xenon.

Original language	English
Article number	P01019
Journal	Journal of Instrumentation
Volume	15
Issue number	1
DOIs	https://doi.org/10.1088/1748-0221/15/01/P01019
State	Published - Jan 17 2020

Bibliographical note

Publisher Copyright:
© 2020 IOP Publishing Ltd and Sissa Medialab.

Keywords

Dark Matter detectors (WIMPs, axions, etc.)
Double-beta decay detectors
Noble liquid detectors (scintillation, ionization, double-phase)
Photon detectors for UV, visible and IR photons (solid-state) (PIN diodes, APDs, Si-PMTs, G-APDs, CCDs, EBCCDs, EMCCDs, CMOS imagers, etc)

ASJC Scopus subject areas

Instrumentation
Mathematical Physics

Access to Document

10.1088/1748-0221/15/01/P01019

Cite this

Nakarmi, P., Ostrovskiy, I., Soma, A. K., Retière, F., Kharusi, S. A., Alfaris, M., Anton, G., Arnquist, I. J., Badhrees, I., Barbeau, P. S., Beck, D., Belov, V., Bhatta, T., Blatchford, J., Breur, P. A., Brodsky, J. P., Brown, E., Brunner, T., Mamahit, S. B., ... Ziegler, T. (2020). Reflectivity and PDE of VUV4 Hamamatsu SiPMs in liquid xenon. Journal of Instrumentation, 15(1), Article P01019. https://doi.org/10.1088/1748-0221/15/01/P01019

@article{75fcd55e38f6473d84d0c9e7d8c440c2,

title = "Reflectivity and PDE of VUV4 Hamamatsu SiPMs in liquid xenon",

abstract = "Understanding reflective properties of materials and photodetection efficiency (PDE) of photodetectors is important for optimizing energy resolution and sensitivity of the next generation neutrinoless double beta decay, direct detection dark matter, and neutrino oscillation experiments that will use noble liquid gases, such as nEXO, DARWIN, DarkSide-20k, and DUNE . Little information is currently available about reflectivity and PDE in liquid noble gases, because such measurements are difficult to conduct in a cryogenic environment and at short enough wavelengths. Here we report a measurement of specular reflectivity and relative PDE of Hamamatsu VUV4 silicon photomultipliers (SiPMs) with 50 μm micro-cells conducted with xenon scintillation light (∼175 nm) in liquid xenon. The specular reflectivity at 15&circ; incidence of three samples of VUV4 SiPMs is found to be 30.4±1.4%, 28.6±1.3%, and 28.0±1.3%, respectively. The PDE at normal incidence differs by ±8% (standard deviation) among the three devices. The angular dependence of the reflectivity and PDE was also measured for one of the SiPMs. Both the reflectivity and PDE decrease as the angle of incidence increases. This is the first measurement of an angular dependence of PDE and reflectivity of a SiPM in liquid xenon.",

keywords = "Dark Matter detectors (WIMPs, axions, etc.), Double-beta decay detectors, Noble liquid detectors (scintillation, ionization, double-phase), Photon detectors for UV, visible and IR photons (solid-state) (PIN diodes, APDs, Si-PMTs, G-APDs, CCDs, EBCCDs, EMCCDs, CMOS imagers, etc)",

author = "P. Nakarmi and I. Ostrovskiy and Soma, {A. K.} and F. Reti{\`e}re and Kharusi, {S. Al} and M. Alfaris and G. Anton and Arnquist, {I. J.} and I. Badhrees and Barbeau, {P. S.} and D. Beck and V. Belov and T. Bhatta and J. Blatchford and Breur, {P. A.} and Brodsky, {J. P.} and E. Brown and T. Brunner and Mamahit, {S. Byrne} and E. Caden and Cao, {G. F.} and L. Cao and C. Chambers and B. Chana and Charlebois, {S. A.} and M. Chiu and B. Cleveland and M. Coon and A. Craycraft and J. Dalmasson and T. Daniels and L. Darroch and Croix, {A. De St} and Mesrobian-Kabakian, {A. Der} and R. Devoe and Vacri, {M. L.Di} and J. Dilling and Ding, {Y. Y.} and Dolinski, {M. J.} and L. Doria and A. Dragone and J. Echevers and F. Edaltafar and M. Elbeltagi and L. Fabris and D. Fairbank and W. Fairbank and J. Farine and S. Ferrara and S. Feyzbakhsh and R. Fontaine and A. Fucarino and G. Gallina and P. Gautam and G. Giacomini and D. Goeldi and R. Gornea and G. Gratta and Hansen, {E. V.} and M. Heffner and Hoppe, {E. W.} and J. H{\"o}{\ss}l and A. House and M. Hughes and A. Iverson and A. Jamil and Jewell, {M. J.} and Jiang, {X. S.} and A. Karelin and Kaufman, {L. J.} and T. Koffas and R. Kr{\"u}cken and A. Kuchenkov and Kumar, {K. S.} and Y. Lan and A. Larson and Leach, {K. G.} and Lenardo, {B. G.} and Leonard, {D. S.} and G. Li and S. Li and Z. Li and C. Licciardi and P. Lv and R. Maclellan and N. Massacret and T. McElroy and M. Medina-Peregrina and T. Michel and B. Mong and Moore, {D. C.} and K. Murray and Natzke, {C. R.} and Newby, {R. J.} and Z. Ning and O. Njoya and F. Nolet and O. Nusair and K. Odgers and A. Odian and M. Oriunno and Orrell, {J. L.} and Ortega, {G. S.} and Overman, {C. T.} and S. Parent and A. Piepke and A. Pocar and Pratte, {J. F.} and V. Radeka and E. Raguzin and S. Rescia and M. Richman and A. Robinson and T. Rossignol and Rowson, {P. C.} and N. Roy and J. Runge and R. Saldanha and S. Sangiorgio and Viii, {K. Skarpaas} and G. St-Hilaire and V. Stekhanov and T. Stiegler and Sun, {X. L.} and M. Tarka and J. Todd and Totev, {T. I.} and R. Tsang and T. Tsang and F. Vachon and V. Veeraraghavan and S. Viel and G. Visser and C. Vivo-Vilches and Vuilleumier, {J. L.} and M. Wagenpfeil and T. Wager and M. Walent and Q. Wang and M. Ward and J. Watkins and M. Weber and W. Wei and Wen, {L. J.} and U. Wichoski and Wu, {S. X.} and Wu, {W. H.} and X. Wu and Q. Xia and H. Yang and L. Yang and O. Zeldovich and J. Zhao and Y. Zhou and T. Ziegler",

note = "Publisher Copyright: {\textcopyright} 2020 IOP Publishing Ltd and Sissa Medialab.",

year = "2020",

month = jan,

day = "17",

doi = "10.1088/1748-0221/15/01/P01019",

language = "English",

volume = "15",

number = "1",

}

Nakarmi, P, Ostrovskiy, I, Soma, AK, Retière, F, Kharusi, SA, Alfaris, M, Anton, G, Arnquist, IJ, Badhrees, I, Barbeau, PS, Beck, D, Belov, V, Bhatta, T, Blatchford, J, Breur, PA, Brodsky, JP, Brown, E, Brunner, T, Mamahit, SB, Caden, E, Cao, GF, Cao, L, Chambers, C, Chana, B, Charlebois, SA, Chiu, M, Cleveland, B, Coon, M, Craycraft, A, Dalmasson, J, Daniels, T, Darroch, L, Croix, ADS, Mesrobian-Kabakian, AD, Devoe, R, Vacri, MLD, Dilling, J, Ding, YY, Dolinski, MJ, Doria, L, Dragone, A, Echevers, J, Edaltafar, F, Elbeltagi, M, Fabris, L, Fairbank, D, Fairbank, W, Farine, J, Ferrara, S, Feyzbakhsh, S, Fontaine, R, Fucarino, A, Gallina, G, Gautam, P, Giacomini, G, Goeldi, D, Gornea, R, Gratta, G, Hansen, EV, Heffner, M, Hoppe, EW, Hößl, J, House, A, Hughes, M, Iverson, A, Jamil, A, Jewell, MJ, Jiang, XS, Karelin, A, Kaufman, LJ, Koffas, T, Krücken, R, Kuchenkov, A, Kumar, KS, Lan, Y, Larson, A, Leach, KG, Lenardo, BG, Leonard, DS, Li, G, Li, S, Li, Z, Licciardi, C, Lv, P, Maclellan, R, Massacret, N, McElroy, T, Medina-Peregrina, M, Michel, T, Mong, B, Moore, DC, Murray, K, Natzke, CR, Newby, RJ, Ning, Z, Njoya, O, Nolet, F, Nusair, O, Odgers, K, Odian, A, Oriunno, M, Orrell, JL, Ortega, GS, Overman, CT, Parent, S, Piepke, A, Pocar, A, Pratte, JF, Radeka, V, Raguzin, E, Rescia, S, Richman, M, Robinson, A, Rossignol, T, Rowson, PC, Roy, N, Runge, J, Saldanha, R, Sangiorgio, S, Viii, KS, St-Hilaire, G, Stekhanov, V, Stiegler, T, Sun, XL, Tarka, M, Todd, J, Totev, TI, Tsang, R, Tsang, T, Vachon, F, Veeraraghavan, V, Viel, S, Visser, G, Vivo-Vilches, C, Vuilleumier, JL, Wagenpfeil, M, Wager, T, Walent, M, Wang, Q, Ward, M, Watkins, J, Weber, M, Wei, W, Wen, LJ, Wichoski, U, Wu, SX, Wu, WH, Wu, X, Xia, Q, Yang, H, Yang, L, Zeldovich, O, Zhao, J, Zhou, Y & Ziegler, T 2020, 'Reflectivity and PDE of VUV4 Hamamatsu SiPMs in liquid xenon', Journal of Instrumentation, vol. 15, no. 1, P01019. https://doi.org/10.1088/1748-0221/15/01/P01019

TY - JOUR

T1 - Reflectivity and PDE of VUV4 Hamamatsu SiPMs in liquid xenon

AU - Nakarmi, P.

AU - Ostrovskiy, I.

AU - Soma, A. K.

AU - Retière, F.

AU - Kharusi, S. Al

AU - Alfaris, M.

AU - Anton, G.

AU - Arnquist, I. J.

AU - Badhrees, I.

AU - Barbeau, P. S.

AU - Beck, D.

AU - Belov, V.

AU - Bhatta, T.

AU - Blatchford, J.

AU - Breur, P. A.

AU - Brodsky, J. P.

AU - Brown, E.

AU - Brunner, T.

AU - Mamahit, S. Byrne

AU - Caden, E.

AU - Cao, G. F.

AU - Cao, L.

AU - Chambers, C.

AU - Chana, B.

AU - Charlebois, S. A.

AU - Chiu, M.

AU - Cleveland, B.

AU - Coon, M.

AU - Craycraft, A.

AU - Dalmasson, J.

AU - Daniels, T.

AU - Darroch, L.

AU - Croix, A. De St

AU - Mesrobian-Kabakian, A. Der

AU - Devoe, R.

AU - Vacri, M. L.Di

AU - Dilling, J.

AU - Ding, Y. Y.

AU - Dolinski, M. J.

AU - Doria, L.

AU - Dragone, A.

AU - Echevers, J.

AU - Edaltafar, F.

AU - Elbeltagi, M.

AU - Fabris, L.

AU - Fairbank, D.

AU - Fairbank, W.

AU - Farine, J.

AU - Ferrara, S.

AU - Feyzbakhsh, S.

AU - Fontaine, R.

AU - Fucarino, A.

AU - Gallina, G.

AU - Gautam, P.

AU - Giacomini, G.

AU - Goeldi, D.

AU - Gornea, R.

AU - Gratta, G.

AU - Hansen, E. V.

AU - Heffner, M.

AU - Hoppe, E. W.

AU - Hößl, J.

AU - House, A.

AU - Hughes, M.

AU - Iverson, A.

AU - Jamil, A.

AU - Jewell, M. J.

AU - Jiang, X. S.

AU - Karelin, A.

AU - Kaufman, L. J.

AU - Koffas, T.

AU - Krücken, R.

AU - Kuchenkov, A.

AU - Kumar, K. S.

AU - Lan, Y.

AU - Larson, A.

AU - Leach, K. G.

AU - Lenardo, B. G.

AU - Leonard, D. S.

AU - Li, G.

AU - Li, S.

AU - Li, Z.

AU - Licciardi, C.

AU - Lv, P.

AU - Maclellan, R.

AU - Massacret, N.

AU - McElroy, T.

AU - Medina-Peregrina, M.

AU - Michel, T.

AU - Mong, B.

AU - Moore, D. C.

AU - Murray, K.

AU - Natzke, C. R.

AU - Newby, R. J.

AU - Ning, Z.

AU - Njoya, O.

AU - Nolet, F.

AU - Nusair, O.

AU - Odgers, K.

AU - Odian, A.

AU - Oriunno, M.

AU - Orrell, J. L.

AU - Ortega, G. S.

AU - Overman, C. T.

AU - Parent, S.

AU - Piepke, A.

AU - Pocar, A.

AU - Pratte, J. F.

AU - Radeka, V.

AU - Raguzin, E.

AU - Rescia, S.

AU - Richman, M.

AU - Robinson, A.

AU - Rossignol, T.

AU - Rowson, P. C.

AU - Roy, N.

AU - Runge, J.

AU - Saldanha, R.

AU - Sangiorgio, S.

AU - Viii, K. Skarpaas

AU - St-Hilaire, G.

AU - Stekhanov, V.

AU - Stiegler, T.

AU - Sun, X. L.

AU - Tarka, M.

AU - Todd, J.

AU - Totev, T. I.

AU - Tsang, R.

AU - Tsang, T.

AU - Vachon, F.

AU - Veeraraghavan, V.

AU - Viel, S.

AU - Visser, G.

AU - Vivo-Vilches, C.

AU - Vuilleumier, J. L.

AU - Wagenpfeil, M.

AU - Wager, T.

AU - Walent, M.

AU - Wang, Q.

AU - Ward, M.

AU - Watkins, J.

AU - Weber, M.

AU - Wei, W.

AU - Wen, L. J.

AU - Wichoski, U.

AU - Wu, S. X.

AU - Wu, W. H.

AU - Wu, X.

AU - Xia, Q.

AU - Yang, H.

AU - Yang, L.

AU - Zeldovich, O.

AU - Zhao, J.

AU - Zhou, Y.

AU - Ziegler, T.

PY - 2020/1/17

Y1 - 2020/1/17

N2 - Understanding reflective properties of materials and photodetection efficiency (PDE) of photodetectors is important for optimizing energy resolution and sensitivity of the next generation neutrinoless double beta decay, direct detection dark matter, and neutrino oscillation experiments that will use noble liquid gases, such as nEXO, DARWIN, DarkSide-20k, and DUNE . Little information is currently available about reflectivity and PDE in liquid noble gases, because such measurements are difficult to conduct in a cryogenic environment and at short enough wavelengths. Here we report a measurement of specular reflectivity and relative PDE of Hamamatsu VUV4 silicon photomultipliers (SiPMs) with 50 μm micro-cells conducted with xenon scintillation light (∼175 nm) in liquid xenon. The specular reflectivity at 15&circ; incidence of three samples of VUV4 SiPMs is found to be 30.4±1.4%, 28.6±1.3%, and 28.0±1.3%, respectively. The PDE at normal incidence differs by ±8% (standard deviation) among the three devices. The angular dependence of the reflectivity and PDE was also measured for one of the SiPMs. Both the reflectivity and PDE decrease as the angle of incidence increases. This is the first measurement of an angular dependence of PDE and reflectivity of a SiPM in liquid xenon.

AB - Understanding reflective properties of materials and photodetection efficiency (PDE) of photodetectors is important for optimizing energy resolution and sensitivity of the next generation neutrinoless double beta decay, direct detection dark matter, and neutrino oscillation experiments that will use noble liquid gases, such as nEXO, DARWIN, DarkSide-20k, and DUNE . Little information is currently available about reflectivity and PDE in liquid noble gases, because such measurements are difficult to conduct in a cryogenic environment and at short enough wavelengths. Here we report a measurement of specular reflectivity and relative PDE of Hamamatsu VUV4 silicon photomultipliers (SiPMs) with 50 μm micro-cells conducted with xenon scintillation light (∼175 nm) in liquid xenon. The specular reflectivity at 15&circ; incidence of three samples of VUV4 SiPMs is found to be 30.4±1.4%, 28.6±1.3%, and 28.0±1.3%, respectively. The PDE at normal incidence differs by ±8% (standard deviation) among the three devices. The angular dependence of the reflectivity and PDE was also measured for one of the SiPMs. Both the reflectivity and PDE decrease as the angle of incidence increases. This is the first measurement of an angular dependence of PDE and reflectivity of a SiPM in liquid xenon.

KW - Dark Matter detectors (WIMPs, axions, etc.)

KW - Double-beta decay detectors

KW - Noble liquid detectors (scintillation, ionization, double-phase)

KW - Photon detectors for UV, visible and IR photons (solid-state) (PIN diodes, APDs, Si-PMTs, G-APDs, CCDs, EBCCDs, EMCCDs, CMOS imagers, etc)

UR - http://www.scopus.com/inward/record.url?scp=85082171393&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85082171393&partnerID=8YFLogxK

U2 - 10.1088/1748-0221/15/01/P01019

DO - 10.1088/1748-0221/15/01/P01019

M3 - Article

AN - SCOPUS:85082171393

SN - 1748-0221

VL - 15

JO - Journal of Instrumentation

JF - Journal of Instrumentation

IS - 1

M1 - P01019

ER -

Reflectivity and PDE of VUV4 Hamamatsu SiPMs in liquid xenon

Abstract

Bibliographical note

Keywords

ASJC Scopus subject areas

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