Abstract
Reliability of power inverters is of paramount importance in safety-critical applications, such as electric vehicles, electric aircrafts, and the like. A failure of a semiconductor device may cause cascaded faults in the power inverters and thus the systems or even lead to catastrophic disasters. Particularly, for low-speed high-power motor-drive applications, the power cycling lifetime of semiconductor device and thus the power inverters will be subject to dramatic degradation during long time of heavy-duty operation, which in fact has received little attention over the past years. In this paper, a novel discontinuous pulse width modulation (NDPWM) strategy will be investigated to improve the power cycling lifetime of MOSFET-based power inverters for low-speed high-power motor-drive applications. Simulation and experimental results verified the efficacy of the NDPWM method, and performance comparison is conducted with the traditional SVPWM and DPWM methods.
Original language | English |
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Title of host publication | 34th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2019 |
Pages | 2620-2626 |
Number of pages | 7 |
ISBN (Electronic) | 9781538683309 |
DOIs | |
State | Published - May 24 2019 |
Event | 34th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2019 - Anaheim, United States Duration: Mar 17 2019 → Mar 21 2019 |
Publication series
Name | Conference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC |
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Volume | 2019-March |
Conference
Conference | 34th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2019 |
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Country/Territory | United States |
City | Anaheim |
Period | 3/17/19 → 3/21/19 |
Bibliographical note
Publisher Copyright:© 2019 IEEE.
Keywords
- Junction temperature swing
- Low-speed inverter drive
- Novel discontinuous PWM method
- Reliability
- Semiconductor device
ASJC Scopus subject areas
- Electrical and Electronic Engineering