Reliability improvement of power inverters for low-speed high-power motor drives

Yu Zou, Sandun Kuruppu, Jiangbiao He, Bojian Cao

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

2 Scopus citations

Abstract

Reliability of power inverters is of paramount importance in safety-critical applications, such as electric vehicles, electric aircrafts, and the like. A failure of a semiconductor device may cause cascaded faults in the power inverters and thus the systems or even lead to catastrophic disasters. Particularly, for low-speed high-power motor-drive applications, the power cycling lifetime of semiconductor device and thus the power inverters will be subject to dramatic degradation during long time of heavy-duty operation, which in fact has received little attention over the past years. In this paper, a novel discontinuous pulse width modulation (NDPWM) strategy will be investigated to improve the power cycling lifetime of MOSFET-based power inverters for low-speed high-power motor-drive applications. Simulation and experimental results verified the efficacy of the NDPWM method, and performance comparison is conducted with the traditional SVPWM and DPWM methods.

Original languageEnglish
Title of host publication34th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2019
Pages2620-2626
Number of pages7
ISBN (Electronic)9781538683309
DOIs
StatePublished - May 24 2019
Event34th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2019 - Anaheim, United States
Duration: Mar 17 2019Mar 21 2019

Publication series

NameConference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC
Volume2019-March

Conference

Conference34th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2019
Country/TerritoryUnited States
CityAnaheim
Period3/17/193/21/19

Bibliographical note

Publisher Copyright:
© 2019 IEEE.

Keywords

  • Junction temperature swing
  • Low-speed inverter drive
  • Novel discontinuous PWM method
  • Reliability
  • Semiconductor device

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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