SaR: Self-adaptive Refinement on Pseudo Labels for Multiclass-Imbalanced Semi-supervised Learning

Zhengfeng Lai, Chao Wang, Sen Ching Cheung, Chen Nee Chuah

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

12 Scopus citations

Abstract

Class-imbalanced datasets can severely deteriorate the performance of semi-supervised learning (SSL). This is due to the confirmation bias especially when the pseudo labels are highly biased towards the majority classes. Traditional resampling or reweighting techniques may not be directly applicable when the unlabeled data distribution is unknown. Inspired by the threshold-moving method that performs well in supervised learning-based binary classification tasks, we provide a simple yet effective scheme to address the multiclass imbalance issue of SSL. This scheme, named SaR, is a Self-adaptive Refinement of soft labels before generating pseudo labels. The pseudo labels generated post-SaR will be less biased, resulting in higher quality data for training the classifier. We show that SaR can consistently improve recent consistency-based SSL algorithms on various image classification problems across different imbalanced ratios. We also show that SaR is robust to the situations where unlabeled data have different distributions as labeled data. Hence, SaR does not rely on the assumptions that unlabeled data share the same distribution as the labeled data.

Original languageEnglish
Title of host publicationProceedings - 2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2022
Pages4090-4099
Number of pages10
ISBN (Electronic)9781665487399
DOIs
StatePublished - 2022
Event2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2022 - New Orleans, United States
Duration: Jun 19 2022Jun 20 2022

Publication series

NameIEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops
Volume2022-June
ISSN (Print)2160-7508
ISSN (Electronic)2160-7516

Conference

Conference2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2022
Country/TerritoryUnited States
CityNew Orleans
Period6/19/226/20/22

Bibliographical note

Publisher Copyright:
© 2022 IEEE.

ASJC Scopus subject areas

  • Computer Vision and Pattern Recognition
  • Electrical and Electronic Engineering

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