Scan start-up demonstration test

Michelle L.Depoy Smith, William S. Griffith

Research output: Contribution to journalArticlepeer-review

1 Scopus citations


The CSTF and TSTF binary start-up demonstration tests have been studied in the literature. It has been shown that both tests perform optimal for various situations but neither one is an overall best test. Therefore, we propose a new demonstration test that is a compromise between the CSTF and TSTF start-up demonstration tests. The practitioner would accept the equipment if a cluster of successes occur prior to a preset number of failures, and rejection otherwise. Markov chains are used in the probabilistic analysis and this is extended to the non-i.i.d. case. Point and interval estimation is studied.

Original languageEnglish
Article number1550014
JournalInternational Journal of Reliability, Quality and Safety Engineering
Issue number3
StatePublished - Jun 23 2015

Bibliographical note

Publisher Copyright:
© 2015 World Scientific Publishing Company.


  • Bernoulli trials
  • Markov chains
  • Quality control
  • acceptance testing
  • reliability
  • runs rules

ASJC Scopus subject areas

  • Computer Science (all)
  • Nuclear Energy and Engineering
  • Safety, Risk, Reliability and Quality
  • Aerospace Engineering
  • Energy Engineering and Power Technology
  • Industrial and Manufacturing Engineering
  • Electrical and Electronic Engineering


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