Scandate cathode work function measurements at elevated temperature

Tyler Maxwell, Xiaotao Liu, Qunfei Zhou, Matthew J. Beck, T. John Balk, Bernard Vancil

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

The work function of a scandate cathode prepared using the L-S technique, and measured in vacuum at elevated temperature, is presented here. The scandate cathode had undergone emission testing and displayed excellent emission behavior in a close-spaced diode testing apparatus, before the work function measurements were carried out. The work function at room temperature was measured to be 4.81 eV, and this value tended to decrease as the temperature was raised to 800°C, with a minimum value existing at 600°C. The implications for this behavior are also discussed.

Original languageEnglish
Title of host publication2018 IEEE International Vacuum Electronics Conference, IVEC 2018
Pages229-230
Number of pages2
ISBN (Electronic)9781538604540
DOIs
StatePublished - Jun 20 2018
Event19th IEEE International Vacuum Electronics Conference, IVEC 2018 - Monterey, United States
Duration: Apr 23 2018Apr 26 2018

Publication series

Name2018 IEEE International Vacuum Electronics Conference, IVEC 2018

Conference

Conference19th IEEE International Vacuum Electronics Conference, IVEC 2018
Country/TerritoryUnited States
CityMonterey
Period4/23/184/26/18

Bibliographical note

Publisher Copyright:
© 2018 IEEE.

Keywords

  • Kelvin probe
  • dispenser cathode
  • scandate cathode
  • work function

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Instrumentation

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