Scandate cathode work function measurements at elevated temperature

Tyler Maxwell; Xiaotao Liu; Qunfei Zhou; Matthew J. Beck; T. John Balk; Bernard Vancil

doi:10.1109/IVEC.2018.8391631

Scandate cathode work function measurements at elevated temperature

Tyler Maxwell, Xiaotao Liu, Qunfei Zhou, Matthew J. Beck, T. John Balk, Bernard Vancil

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

The work function of a scandate cathode prepared using the L-S technique, and measured in vacuum at elevated temperature, is presented here. The scandate cathode had undergone emission testing and displayed excellent emission behavior in a close-spaced diode testing apparatus, before the work function measurements were carried out. The work function at room temperature was measured to be 4.81 eV, and this value tended to decrease as the temperature was raised to 800°C, with a minimum value existing at 600°C. The implications for this behavior are also discussed.

Original language	English
Title of host publication	2018 IEEE International Vacuum Electronics Conference, IVEC 2018
Pages	229-230
Number of pages	2
ISBN (Electronic)	9781538604540
DOIs	https://doi.org/10.1109/IVEC.2018.8391631
State	Published - Jun 20 2018
Event	19th IEEE International Vacuum Electronics Conference, IVEC 2018 - Monterey, United States Duration: Apr 23 2018 → Apr 26 2018

Publication series

Name	2018 IEEE International Vacuum Electronics Conference, IVEC 2018

Conference

Conference	19th IEEE International Vacuum Electronics Conference, IVEC 2018
Country/Territory	United States
City	Monterey
Period	4/23/18 → 4/26/18

Bibliographical note

Funding Information:
This work was financially supported by the Defense Advanced Research Projects Agency (DARPA) Innovative Vacuum Electronics Science and Technology (INVEST) program, under grant number N66001-16-1-4041.

Publisher Copyright:
© 2018 IEEE.

Keywords

Kelvin probe
dispenser cathode
scandate cathode
work function

ASJC Scopus subject areas

Electrical and Electronic Engineering
Instrumentation

Access to Document

10.1109/IVEC.2018.8391631

Cite this

@inproceedings{9f7e760713ec4572ab287d73b92f811d,

title = "Scandate cathode work function measurements at elevated temperature",

abstract = "The work function of a scandate cathode prepared using the L-S technique, and measured in vacuum at elevated temperature, is presented here. The scandate cathode had undergone emission testing and displayed excellent emission behavior in a close-spaced diode testing apparatus, before the work function measurements were carried out. The work function at room temperature was measured to be 4.81 eV, and this value tended to decrease as the temperature was raised to 800°C, with a minimum value existing at 600°C. The implications for this behavior are also discussed.",

keywords = "Kelvin probe, dispenser cathode, scandate cathode, work function",

author = "Tyler Maxwell and Xiaotao Liu and Qunfei Zhou and Beck, {Matthew J.} and Balk, {T. John} and Bernard Vancil",

note = "Funding Information: This work was financially supported by the Defense Advanced Research Projects Agency (DARPA) Innovative Vacuum Electronics Science and Technology (INVEST) program, under grant number N66001-16-1-4041. Publisher Copyright: {\textcopyright} 2018 IEEE.; null ; Conference date: 23-04-2018 Through 26-04-2018",

year = "2018",

month = jun,

day = "20",

doi = "10.1109/IVEC.2018.8391631",

language = "English",

series = "2018 IEEE International Vacuum Electronics Conference, IVEC 2018",

pages = "229--230",

booktitle = "2018 IEEE International Vacuum Electronics Conference, IVEC 2018",

}

Maxwell, T, Liu, X, Zhou, Q, Beck, MJ , Balk, TJ & Vancil, B 2018, Scandate cathode work function measurements at elevated temperature. in 2018 IEEE International Vacuum Electronics Conference, IVEC 2018. 2018 IEEE International Vacuum Electronics Conference, IVEC 2018, pp. 229-230, 19th IEEE International Vacuum Electronics Conference, IVEC 2018, Monterey, United States, 4/23/18. https://doi.org/10.1109/IVEC.2018.8391631

Scandate cathode work function measurements at elevated temperature. / Maxwell, Tyler; Liu, Xiaotao; Zhou, Qunfei et al.

2018 IEEE International Vacuum Electronics Conference, IVEC 2018. 2018. p. 229-230 (2018 IEEE International Vacuum Electronics Conference, IVEC 2018).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Scandate cathode work function measurements at elevated temperature

AU - Maxwell, Tyler

AU - Liu, Xiaotao

AU - Zhou, Qunfei

AU - Beck, Matthew J.

AU - Balk, T. John

AU - Vancil, Bernard

N1 - Funding Information: This work was financially supported by the Defense Advanced Research Projects Agency (DARPA) Innovative Vacuum Electronics Science and Technology (INVEST) program, under grant number N66001-16-1-4041. Publisher Copyright: © 2018 IEEE.

PY - 2018/6/20

Y1 - 2018/6/20

N2 - The work function of a scandate cathode prepared using the L-S technique, and measured in vacuum at elevated temperature, is presented here. The scandate cathode had undergone emission testing and displayed excellent emission behavior in a close-spaced diode testing apparatus, before the work function measurements were carried out. The work function at room temperature was measured to be 4.81 eV, and this value tended to decrease as the temperature was raised to 800°C, with a minimum value existing at 600°C. The implications for this behavior are also discussed.

AB - The work function of a scandate cathode prepared using the L-S technique, and measured in vacuum at elevated temperature, is presented here. The scandate cathode had undergone emission testing and displayed excellent emission behavior in a close-spaced diode testing apparatus, before the work function measurements were carried out. The work function at room temperature was measured to be 4.81 eV, and this value tended to decrease as the temperature was raised to 800°C, with a minimum value existing at 600°C. The implications for this behavior are also discussed.

KW - Kelvin probe

KW - dispenser cathode

KW - scandate cathode

KW - work function

UR - http://www.scopus.com/inward/record.url?scp=85050022952&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85050022952&partnerID=8YFLogxK

U2 - 10.1109/IVEC.2018.8391631

DO - 10.1109/IVEC.2018.8391631

M3 - Conference contribution

AN - SCOPUS:85050022952

T3 - 2018 IEEE International Vacuum Electronics Conference, IVEC 2018

SP - 229

EP - 230

BT - 2018 IEEE International Vacuum Electronics Conference, IVEC 2018

Y2 - 23 April 2018 through 26 April 2018

ER -

Scandate cathode work function measurements at elevated temperature

Abstract

Publication series

Conference

Bibliographical note

Keywords

ASJC Scopus subject areas

Access to Document

Other files and links

Fingerprint

Cite this