Scanning tunneling microscope with long range lateral motion

J. Nichols, K. W. Ng

Research output: Contribution to journalArticlepeer-review

Abstract

We present our work on a recently built scanning tunneling microscope (STM), with coarse motion in two-dimensions. The tip of this STM can be translated a few millimeters in directions both parallel and perpendicular to the tip. This feature allows sampling of a larger area for experiments such as the study of how the electrical properties of charge density waves evolve between contacts, the proximity effect near a normal metal-superconducting interface, charge transport near the contact of a semiconductor interface, and for finding microscopically small samples like graphene. This STM is based on one of our previous one-dimensional designs. It utilizes orchestrated motion of six piezoelectric tubes in a slip-stick configuration in order to produce long range motion for the walker. This device is a single unit with a compact design making it very stable. It is stable enough to obtain atomic resolution on HOPG. It can operate in either a horizontal or vertical configuration and at cryogenic temperatures. It was designed entirely from non-magnetic materials for potential work in a magnetic field.

Original languageEnglish
Pages (from-to)1852-1854
Number of pages3
JournalPhysica B: Condensed Matter
Volume407
Issue number11
DOIs
StatePublished - Jun 1 2012

Bibliographical note

Funding Information:
This work was supported by the US National Science Foundation under Grant nos. DMR 0800367 and EPS-0814194 .

Funding

This work was supported by the US National Science Foundation under Grant nos. DMR 0800367 and EPS-0814194 .

FundersFunder number
National Science Foundation (NSF)DMR 0800367, EPS-0814194

    Keywords

    • Atomic resolution
    • Scanning tunneling microscope
    • Two-dimensional

    ASJC Scopus subject areas

    • Electronic, Optical and Magnetic Materials
    • Condensed Matter Physics
    • Electrical and Electronic Engineering

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