Scanning tunneling microscope with two-dimensional translator

J. Nichols, K. W. Ng

Research output: Contribution to journalArticlepeer-review

2 Scopus citations


Since the invention of the scanning tunneling microscope (STM), it has been a powerful tool for probing the electronic properties of materials. Typically STM designs capable of obtaining resolution on the atomic scale are limited to a small area which can be probed. We have built an STM capable of coarse motion in two dimensions, the z- and x-directions which are, respectively, parallel and perpendicular to the tip. This allows us to image samples with very high resolution at sites separated by macroscopic distances. This device is a single unit with a compact design making it very stable. It can operate in either a horizontal or vertical configuration and at cryogenic temperatures.

Original languageEnglish
Article number013706
JournalReview of Scientific Instruments
Issue number1
StatePublished - Jan 2011

Bibliographical note

Funding Information:
This work was supported by the U.S. National Science Foundation under Grant Nos. DMR-0800367 and EPS-0814194.

ASJC Scopus subject areas

  • Instrumentation


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