Since the invention of the scanning tunneling microscope (STM), it has been a powerful tool for probing the electronic properties of materials. Typically STM designs capable of obtaining resolution on the atomic scale are limited to a small area which can be probed. We have built an STM capable of coarse motion in two dimensions, the z- and x-directions which are, respectively, parallel and perpendicular to the tip. This allows us to image samples with very high resolution at sites separated by macroscopic distances. This device is a single unit with a compact design making it very stable. It can operate in either a horizontal or vertical configuration and at cryogenic temperatures.
|Journal||Review of Scientific Instruments|
|State||Published - Jan 2011|
Bibliographical noteFunding Information:
This work was supported by the U.S. National Science Foundation under Grant Nos. DMR-0800367 and EPS-0814194.
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