SH-wave diffraction by an interfacial flaw in monoclinic bimaterials

L. M. Brock, M. T. Hanson

Research output: Contribution to journalArticlepeer-review

2 Scopus citations


A system of incident, reflected and transmitted plane SH-waves is diffracted by an interface flaw in two dissimilar linearly elastic anisotropic half-spaces. The half-space solids have single planes of material symmetry. These coincide, but the two sets of principal material axes in the common plane have arbitrary orientations with respect to each other and to the interface. Exact transient solutions show the effects of material properties and orientation. Increasing the degree of non-orthotropy causes the maximum and minimum shear wave speeds in each solid to deviate more from the isotropic limit. For a non-orthotropic/isotropic bimaterial, this also causes the dynamic stress intensity factor to decrease, and the factor always falls below the factor value arising for a homogeneous solid with properties identical to those of the isotropic constituent.

Original languageEnglish
Pages (from-to)5683-5697
Number of pages15
JournalInternational Journal of Solids and Structures
Issue number23
StatePublished - Nov 11 2002


  • Diffraction
  • Interface flaw
  • Non-orthotropy
  • Stress intensity factor
  • Transient analysis
  • Wave propagation

ASJC Scopus subject areas

  • Modeling and Simulation
  • Materials Science (all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering
  • Applied Mathematics


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