Site-specific FIB preparation of atom probe samples

H. O. Colijn, T. F. Kelly, R. M. Ulfig, R. G. Buchheit

Research output: Contribution to journal › Article › peer-review

22 Scopus citations

Original language	English
Pages (from-to)	1150-1151
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	10
Issue number	SUPPL. 2
DOIs	https://doi.org/10.1017/S1431927604883193
State	Published - 2004

ASJC Scopus subject areas

TY - JOUR

T1 - Site-specific FIB preparation of atom probe samples

AU - Colijn, H. O.

AU - Kelly, T. F.

AU - Ulfig, R. M.

AU - Buchheit, R. G.

PY - 2004

Y1 - 2004

UR - http://www.scopus.com/inward/record.url?scp=4544343988&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=4544343988&partnerID=8YFLogxK

U2 - 10.1017/S1431927604883193

DO - 10.1017/S1431927604883193

M3 - Article

AN - SCOPUS:4544343988

SN - 1431-9276

VL - 10

SP - 1150

EP - 1151

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - SUPPL. 2

ER -