Site-specific FIB preparation of atom probe samples

H. O. Colijn, T. F. Kelly, R. M. Ulfig, R. G. Buchheit

Research output: Contribution to journalArticlepeer-review

21 Scopus citations
Original languageEnglish
Pages (from-to)1150-1151
Number of pages2
JournalMicroscopy and Microanalysis
Issue numberSUPPL. 2
StatePublished - 2004

ASJC Scopus subject areas

  • Instrumentation


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