Stress effect on self-limiting lithiation in silicon-nanowire electrode

Considering the coupling between lithiation-induced stress and the migration of lithium, we develop a modified Cahn-Hilliard type phase-field model to analyze the self-limiting lithiation in a silicon nanowire, which takes account of the stress effect on the migration of lithium in the frameworks of thermodynamics and viscoplasticity. Two limiting constraints to the ends of the silicon nanowire are considered; one is freestanding, and the other has fixed ends. Numerical analysis reveals the large compressive-hydrostatic stress at the interphase impedes the migration of lithium. The numerical result of the Li-poor phase thickness is in accord with experimental results reported in literature.