Study of the impact performance of solder joints by high-velocity impact tests

Ning Zhang, Yaowu Shi, Fu Guo, Fuqian Yang

Research output: Contribution to journalArticlepeer-review

6 Scopus citations

Abstract

The impact behavior of solder joints was studied using three different high-velocity impact tests: the U-notch Charpy impact test, the no-notch Charpy impact test, and a laboratory-designed drop test. The solder joints were made of five solder alloys, Sn-37Pb, Sn-3.8Ag-0.7Cu, Sn-2.0Ag-0.7Cu, Sn-1.0Ag-0.7Cu, and Sn-0.7Ag-0.7Cu (in wt.%), in which the traditional Cu/solder/Cu butt joint was used. All three impact tests gave the same trend of the impact behavior of the solder joints, with the Sn-37Pb joints having the highest impact resistance and the Sn-3.8Ag-0.7Cu joints having the lowest impact resistance. For the lead-free joints, the Sn-1.0Ag-0.7Cu joints had better impact resistance than the Sn-2.0Ag-0.7Cu joints, and the Sn-2.0Ag-0.7Cu joints better than the Sn-0.7Ag-0.7Cu joints. The impact behavior was correlated well to the fracture morphologies observed by scanning electron microscopy (SEM). Comparison of the three tests showed that the no-notch Charpy impact test is a promising method for evaluating the drop performance of solder joints.

Original languageEnglish
Pages (from-to)2536-2543
Number of pages8
JournalJournal of Electronic Materials
Volume39
Issue number12
DOIs
StatePublished - Dec 2010

Bibliographical note

Funding Information:
The present work was performed under the financial support of the National 863 Hi-Tech Scheme (No. 2002AA322040) and the key program for the 11th Five-Year Plan (No. 2006BAE03B02) of the China Department of Science and Technology. The authors would like to give special thanks to the China Scholarship Council for funding support.

Keywords

  • Impact tests
  • impact resistance
  • low-Ag lead-free solders
  • no-notch butt-jointed specimens

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering
  • Materials Chemistry

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