Subpixel edge-detection algorithm based on pseudo-Zernike moments

Kun Zhang, Haiqing Chen, Qingwen Liang, Chong Huang, Jiakun Xu

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

3 Scopus citations

Abstract

In order to meet the demands of high precision localization and anti-interference performance for optoelectronic detection and imaging devices, a new subpixel edge detection approach based on orthogonal Pseudo-Zernike moments is proposed in this paper with both theoretical analysis and experimental demonstration. First, the ideal step model of subpixel edge is established, and the specific characteristics of edge points can be extracted through the convolution with each order of Pseudo-Zernike moments. According to the principle of amplitude rotation invariance, the parameters of subpixel edge can be obtained by analyzing the relationships between different orders and repetitions of Pseudo-Zernike moments when the image edge is rotated to the vertical direction. And then the actual coordination of the subpixel edge point can be identified. Comparing with other approaches such as spatial moment operators, and Zernike moment algorithm, the experiment results prove that the proposed method has the virtue of higher measuring precision and better noise suppression performance. The edge detection accuracy is up to 0.07 pixel for straight lines with noise, and 0.1 pixel for curves with noise. Therefore, it can be concluded that the proposed method is an efficient approach with a relatively high accuracy and stabilization for image edge detection.

Original languageEnglish
Title of host publication5th International Symposium on Advanced Optical Manufacturing and Testing Technologies
Subtitle of host publicationOptoelectronic Materials and Devices for Detector, Imager, Display, and Energy Conversion Technology
DOIs
StatePublished - 2010
Event5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Detector, Imager, Display, and Energy Conversion Technology - Dalian, China
Duration: Apr 26 2010Apr 29 2010

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume7658
ISSN (Print)0277-786X

Conference

Conference5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Detector, Imager, Display, and Energy Conversion Technology
Country/TerritoryChina
CityDalian
Period4/26/104/29/10

Keywords

  • Amplitude rotation invariance irradiance
  • Edge detection
  • Pseudo-Zernike moments
  • Subpixel

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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