Abstract
Trilayers of Co(15 angstroms)/Cr(x)/Co(17 angstroms) have been epitaxially sputtered onto MgO (1 0 0) and (1 1 0) substrates coated with Cr(1 0 0) and (2 1 1) buffer layers, respectively. The Cr thickness x is varied from 6 to 50 angstroms. Both sample sets have the Co c-axis lying in the plane of the film, however, due to the four-fold symmetry of MgO (1 0 0), the Co layers form bicrystals with perpendicularly oriented c-axis. Ferromagnetic resonance measurements clearly show large two-fold and four-fold magnetic in-plane anisotropy for MgO (1 1 0) and MgO (1 0 0) samples, respectively. Magnetization measurements reveal interlayer coupling strengths peaked at a Cr thickness of approximately 10 angstroms for both symmetries, but the strength decreases more slowly with increasing tCr in the MgO (1 0 0) system.
| Original language | English |
|---|---|
| Pages (from-to) | 387-390 |
| Number of pages | 4 |
| Journal | Journal of Magnetism and Magnetic Materials |
| Volume | 198 |
| DOIs | |
| State | Published - Jun 1 1999 |
| Event | Proceedings of the 1998 3rd International Symposium on Metallic Multilayers (MML-98) - Vancouver, BC, Can Duration: Jun 14 1998 → Jun 19 1998 |
Bibliographical note
Funding Information:This work was supported by US Department of Energy, Basic Energy Sciences – Materials Sciences under Contracts No. W-31-109-ENG-38 (ANL) and DE-FG02-86ER45281 (Miami).
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics