Symmetry influence on interlayer coupling in epitaxial Co/Cr trilayers grown on MgO (1 0 0) and (1 1 0) substrates

J. Zachary Hilt, J. Johanna Picconatto, Alexandra O'Brien, Michael J. Pechan, Eric E. Fullerton

Research output: Contribution to journalConference articlepeer-review

2 Scopus citations


Trilayers of Co(15 angstroms)/Cr(x)/Co(17 angstroms) have been epitaxially sputtered onto MgO (1 0 0) and (1 1 0) substrates coated with Cr(1 0 0) and (2 1 1) buffer layers, respectively. The Cr thickness x is varied from 6 to 50 angstroms. Both sample sets have the Co c-axis lying in the plane of the film, however, due to the four-fold symmetry of MgO (1 0 0), the Co layers form bicrystals with perpendicularly oriented c-axis. Ferromagnetic resonance measurements clearly show large two-fold and four-fold magnetic in-plane anisotropy for MgO (1 1 0) and MgO (1 0 0) samples, respectively. Magnetization measurements reveal interlayer coupling strengths peaked at a Cr thickness of approximately 10 angstroms for both symmetries, but the strength decreases more slowly with increasing tCr in the MgO (1 0 0) system.

Original languageEnglish
Pages (from-to)387-390
Number of pages4
JournalJournal of Magnetism and Magnetic Materials
StatePublished - Jun 1 1999
EventProceedings of the 1998 3rd International Symposium on Metallic Multilayers (MML-98) - Vancouver, BC, Can
Duration: Jun 14 1998Jun 19 1998

Bibliographical note

Funding Information:
This work was supported by US Department of Energy, Basic Energy Sciences – Materials Sciences under Contracts No. W-31-109-ENG-38 (ANL) and DE-FG02-86ER45281 (Miami).

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics


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