Systematic reliability study of top-gate p- and n-channel organic field-effect transistors

Do Kyung Hwang, Canek Fuentes-Hernandez, Mathieu Fenoll, Minseong Yun, Jihoon Park, Jae Won Shim, Keith A. Knauer, Amir Dindar, Hyungchul Kim, Yongjin Kim, Jungbae Kim, Hyeunseok Cheun, Marcia M. Payne, Samuel Graham, Seongil Im, John E. Anthony, Bernard Kippelen