Template languages for fault monitoring of timed discrete event processes

Deepa N. Pandalai, Larry E. Holloway

Research output: Contribution to journalArticlepeer-review

107 Scopus citations


This paper introduces a new framework for modeling discrete event processes. This framework, called condition templates, allows the modeling of processes in which both single-instance and multiple-instance behaviors are exhibited concurrently. A single-instance behavior corresponds to a trace from a single finite-state process, and a multiple-instance behavior corresponds to the timed interleavings of an unspecified number of identical processes operating at the same time. The template framework allows the modeling of correct operation for systems consisting of concurrent mixtures of both single and multiple-instance behaviors. This representation can then be used in on-line fault monitoring for confirming the correct operation of a system. In order to analyze the modeling power of condition templates, we compare the class of timed languages representable by template models with classes of timed languages from timed automata models. It is shown that templates are able to model timed languages corresponding to single and multiple-instance behaviors and combinations thereof. Templates can thus represent languages that could not be represented or monitored using time automata alone.

Original languageEnglish
Pages (from-to)868-882
Number of pages15
JournalIEEE Transactions on Automatic Control
Issue number5
StatePublished - May 2000

Bibliographical note

Funding Information:
Manuscript received August 4, 1998; revised June 12, 1999. Recommended by Associate Editor, W. Lin. The work of L. E. Holloway was supported by Rockwell International, by the National Science Foundation under Grants ECS-9807106 and CDA-9502645, by NASA under Grant NGT-40049, by the ARO under Grant DAAH04-96-1-0399, and by the Center for Robotics and Manufacturing Systems at the University of Kentucky. D. N. Pandalai is with Motorola Labs, Schaumberg, IL USA.

ASJC Scopus subject areas

  • Control and Systems Engineering
  • Computer Science Applications
  • Electrical and Electronic Engineering


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