The defects of ZnO nanorods passivated by ultra-thin Al2O3 film

Shibin Li; Detao Liu; Peng Zhang; Yafei Wang; Hojjatollah Sarvari; Yaoyu Xuan; Zhi David Chen

doi:10.1149/07202.0275ecst

The defects of ZnO nanorods passivated by ultra-thin Al₂O₃ film

Shibin Li, Detao Liu, Peng Zhang, Yafei Wang, Hojjatollah Sarvari, Yaoyu Xuan, Zhi David Chen

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

3 Scopus citations

Abstract

Despite dramatically improved efficiency of inorganic-organic metal hybrid perovskite solar cells (PSCs), electron transport is still a challenging issue. In this paper, we report the use of hydrothermal self-assembling ZnO nanorods as electron transport layer in perovskite solar cells. The efficiency of perovskite solar cells is dramatically enhanced by passivating the interface defects via atomic layer deposition of Al₂O₃ monolayers on ZnO nanorods. By employing Al₂O₃ monolayers, the power conversion efficiency (PCE) of CH₃NH₃PbI₃ (MAPbI₃) PSCs is typically boosted from ∼10.38% to 14.27% on average, with the highest efficiency of 15.35%. We suggest that passivation of defects using atomic layer deposition of monolayers might provide a new pathway for improving all types of PSCs.

Original language	English
Title of host publication	Dielectrics for Nanosystems 7
Subtitle of host publication	Materials Science, Processing, Reliability, and Manufacturing
Editors	D. Misra, D. Bauza, Z. Chen, K. B. Sundaram, Y. S. Obeng, T. Chikyow, H. Iwai
Pages	275-285
Number of pages	11
Edition	2
ISBN (Electronic)	9781607687122
DOIs	https://doi.org/10.1149/07202.0275ecst
State	Published - 2016
Event	Symposium on Dielectrics for Nanosystems 7: Materials Science, Processing, Reliability, and Manufacturing - 229th ECS Meeting - San Diego, United States Duration: May 29 2016 → Jun 2 2016

Publication series

Name	ECS Transactions
Number	2
Volume	72
ISSN (Print)	1938-6737
ISSN (Electronic)	1938-5862

Conference

Conference	Symposium on Dielectrics for Nanosystems 7: Materials Science, Processing, Reliability, and Manufacturing - 229th ECS Meeting
Country/Territory	United States
City	San Diego
Period	5/29/16 → 6/2/16

Bibliographical note

Publisher Copyright:
©The Electrochemical Society.

ASJC Scopus subject areas

General Engineering

Access to Document

10.1149/07202.0275ecst

Cite this

Li, S., Liu, D., Zhang, P., Wang, Y., Sarvari, H., Xuan, Y., & Chen, Z. D. (2016). The defects of ZnO nanorods passivated by ultra-thin Al₂O₃ film. In D. Misra, D. Bauza, Z. Chen, K. B. Sundaram, Y. S. Obeng, T. Chikyow, & H. Iwai (Eds.), Dielectrics for Nanosystems 7: Materials Science, Processing, Reliability, and Manufacturing (2 ed., pp. 275-285). (ECS Transactions; Vol. 72, No. 2). https://doi.org/10.1149/07202.0275ecst

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title = "The defects of ZnO nanorods passivated by ultra-thin Al2O3 film",

abstract = "Despite dramatically improved efficiency of inorganic-organic metal hybrid perovskite solar cells (PSCs), electron transport is still a challenging issue. In this paper, we report the use of hydrothermal self-assembling ZnO nanorods as electron transport layer in perovskite solar cells. The efficiency of perovskite solar cells is dramatically enhanced by passivating the interface defects via atomic layer deposition of Al2O3 monolayers on ZnO nanorods. By employing Al2O3 monolayers, the power conversion efficiency (PCE) of CH3NH3PbI3 (MAPbI3) PSCs is typically boosted from ∼10.38% to 14.27% on average, with the highest efficiency of 15.35%. We suggest that passivation of defects using atomic layer deposition of monolayers might provide a new pathway for improving all types of PSCs.",

author = "Shibin Li and Detao Liu and Peng Zhang and Yafei Wang and Hojjatollah Sarvari and Yaoyu Xuan and Chen, {Zhi David}",

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Li, S, Liu, D, Zhang, P, Wang, Y, Sarvari, H, Xuan, Y & Chen, ZD 2016, The defects of ZnO nanorods passivated by ultra-thin Al₂O₃ film. in D Misra, D Bauza, Z Chen, KB Sundaram, YS Obeng, T Chikyow & H Iwai (eds), Dielectrics for Nanosystems 7: Materials Science, Processing, Reliability, and Manufacturing. 2 edn, ECS Transactions, no. 2, vol. 72, pp. 275-285, Symposium on Dielectrics for Nanosystems 7: Materials Science, Processing, Reliability, and Manufacturing - 229th ECS Meeting, San Diego, United States, 5/29/16. https://doi.org/10.1149/07202.0275ecst

The defects of ZnO nanorods passivated by ultra-thin Al₂O₃ film. / Li, Shibin; Liu, Detao; Zhang, Peng et al.
Dielectrics for Nanosystems 7: Materials Science, Processing, Reliability, and Manufacturing. ed. / D. Misra; D. Bauza; Z. Chen; K. B. Sundaram; Y. S. Obeng; T. Chikyow; H. Iwai. 2. ed. 2016. p. 275-285 (ECS Transactions; Vol. 72, No. 2).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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