The Nature and Distribution of Materials at the Emitting Surface and Throughout the Thickness of High-Performance Scandate Cathodes

T. John Balk, Huanhuan Bai, Michael J. Detisch, Bernard K. Vancil

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Citation (SciVal)

Abstract

Scandate cathodes offers promise of significant improvements in electron gun performance but are still hindered by two interrelated issues. It is not yet known which processing approach(es) would effectively guarantee strong device performance, and there are remaining questions as to the exact nature and preferred location of the materials and phases that should exist throughout a well-functioning scandate cathode. This study focused on the latter aspect, by providing a detailed understanding of the materials at the emitting surface as well as a more global view of the materials distribution throughout the cathode pellet. Application of advanced specimen preparation methods in combination with detailed materials characterization techniques facilitated a comprehensive understanding of the material phases in scandate cathodes. This study also points the way toward additional characterization experiments for definitive quantification of the surface materials that most directly influence electron emission.

Original languageEnglish
Title of host publication2024 Joint International Vacuum Electronics Conference and International Vacuum Electron Sources Conference, IVEC + IVESC 2024
ISBN (Electronic)9798350348705
DOIs
StatePublished - 2024
Event25th Joint IEEE International Vacuum Electronics Conference and 15th International Vacuum Electron Sources Conference, IVEC + IVESC 2024 - Monterey, United States
Duration: Apr 23 2024Apr 25 2024

Publication series

Name2024 Joint International Vacuum Electronics Conference and International Vacuum Electron Sources Conference, IVEC + IVESC 2024

Conference

Conference25th Joint IEEE International Vacuum Electronics Conference and 15th International Vacuum Electron Sources Conference, IVEC + IVESC 2024
Country/TerritoryUnited States
CityMonterey
Period4/23/244/25/24

Bibliographical note

Publisher Copyright:
© 2024 IEEE.

Keywords

  • broad beam ion milling
  • bulk
  • electron microscopy
  • emission
  • scandate cathode
  • surface

ASJC Scopus subject areas

  • Instrumentation
  • Atomic and Molecular Physics, and Optics
  • Electrical and Electronic Engineering

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