Abstract
Scandate cathodes offers promise of significant improvements in electron gun performance but are still hindered by two interrelated issues. It is not yet known which processing approach(es) would effectively guarantee strong device performance, and there are remaining questions as to the exact nature and preferred location of the materials and phases that should exist throughout a well-functioning scandate cathode. This study focused on the latter aspect, by providing a detailed understanding of the materials at the emitting surface as well as a more global view of the materials distribution throughout the cathode pellet. Application of advanced specimen preparation methods in combination with detailed materials characterization techniques facilitated a comprehensive understanding of the material phases in scandate cathodes. This study also points the way toward additional characterization experiments for definitive quantification of the surface materials that most directly influence electron emission.
Original language | English |
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Title of host publication | 2024 Joint International Vacuum Electronics Conference and International Vacuum Electron Sources Conference, IVEC + IVESC 2024 |
ISBN (Electronic) | 9798350348705 |
DOIs | |
State | Published - 2024 |
Event | 25th Joint IEEE International Vacuum Electronics Conference and 15th International Vacuum Electron Sources Conference, IVEC + IVESC 2024 - Monterey, United States Duration: Apr 23 2024 → Apr 25 2024 |
Publication series
Name | 2024 Joint International Vacuum Electronics Conference and International Vacuum Electron Sources Conference, IVEC + IVESC 2024 |
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Conference
Conference | 25th Joint IEEE International Vacuum Electronics Conference and 15th International Vacuum Electron Sources Conference, IVEC + IVESC 2024 |
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Country/Territory | United States |
City | Monterey |
Period | 4/23/24 → 4/25/24 |
Bibliographical note
Publisher Copyright:© 2024 IEEE.
Keywords
- broad beam ion milling
- bulk
- electron microscopy
- emission
- scandate cathode
- surface
ASJC Scopus subject areas
- Instrumentation
- Atomic and Molecular Physics, and Optics
- Electrical and Electronic Engineering