Abstract
An important aspect to understanding near-field optics and imaging involves the electromagnetic scattering characteristics of objects illuminated by the near field of a sub-wavelength-sized aperture. This paper addresses one particular application of near-field optics: a transmission-mode near-field scanning microscope (NSM). Specifically, some peculiar phenomena are investigated including a near-field focusing effect, as well as an impedance-based image-shape effect. To this end, we first describe the physical attributes of an NSM and then present two computational models we use to characterize this instrument. Both moment-method and finite-difference time-domain models are discussed. These two models are applied to the analysis of the NSM for various configurations and compared to other theoretical and experimental results. Finally, the construction of an X-band NSM is described-which we label a near-field scanning microwave microscope-and the experimental near-field imaging measurements are compared with our numerical predictions.
| Original language | English |
|---|---|
| Pages (from-to) | 91-99 |
| Number of pages | 9 |
| Journal | IEEE Transactions on Microwave Theory and Techniques |
| Volume | 51 |
| Issue number | 1 I |
| DOIs | |
| State | Published - Jan 2003 |
Bibliographical note
Funding Information:Manuscript received June 18, 2001; revised January 25, 2002. This work was supported by the University of Kentucky Medical Center Research Fund, by the University of Kentucky Center for Computational Sciences, and by the National Science Foundation under the Faculty Early Career Development (CAREER) Award ECS-9624486.
Keywords
- Finite-difference time-domain (FDTD) method
- Moment method (MM)
- Near-field imaging
- Near-field scanning microscopy
- Near-field scanning microwave microscope (NSMM)
- Near-field scanning optical microscope (NSOM)
- Thin wires
ASJC Scopus subject areas
- Radiation
- Condensed Matter Physics
- Electrical and Electronic Engineering