Thermal resistances of thin films of small molecule organic semiconductors

Y. Yao, Maryam Shahi, Marcia M. Payne, J. E. Anthony, J. W. Brill

Research output: Contribution to journalArticlepeer-review

7 Scopus citations

Abstract

We have measured the thermal resistances of thin films of the small molecule organic semiconductors bis(triisopropylsilylethynyl) pentacene (TIPS-pn), bis(triethylsilylethynyl) anthradithiophene (TES-ADT) and difluoro bis(triethylsilylethynyl) anthradithiophene (diF-TES-ADT). For each material, several films of different thicknesses have been measured to separate the effects of intrinsic thermal conductivity from interface thermal resistance. For sublimed films of TIPS-pn and diF-TES-ADT, with thicknesses ranging from <100 nm to >4 μm, the thermal conductivities are similar to those of polymers and over an order of magnitude smaller than those of single crystals, presumably reflecting the large reduction in phonon mean-free path in the films. For thin (≤205 nm) crystalline films of TES-ADT, prepared by vapor-annealing spin-cast films, the thermal resistances are dominated by interface scattering.

Original languageEnglish
Pages (from-to)8817-8821
Number of pages5
JournalJournal of Materials Chemistry C
Volume4
Issue number37
DOIs
StatePublished - 2016

Bibliographical note

Publisher Copyright:
© 2016 The Royal Society of Chemistry.

ASJC Scopus subject areas

  • General Chemistry
  • Materials Chemistry

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