Abstract
We have measured the thermal resistances of thin films of the small molecule organic semiconductors bis(triisopropylsilylethynyl) pentacene (TIPS-pn), bis(triethylsilylethynyl) anthradithiophene (TES-ADT) and difluoro bis(triethylsilylethynyl) anthradithiophene (diF-TES-ADT). For each material, several films of different thicknesses have been measured to separate the effects of intrinsic thermal conductivity from interface thermal resistance. For sublimed films of TIPS-pn and diF-TES-ADT, with thicknesses ranging from <100 nm to >4 μm, the thermal conductivities are similar to those of polymers and over an order of magnitude smaller than those of single crystals, presumably reflecting the large reduction in phonon mean-free path in the films. For thin (≤205 nm) crystalline films of TES-ADT, prepared by vapor-annealing spin-cast films, the thermal resistances are dominated by interface scattering.
| Original language | English |
|---|---|
| Pages (from-to) | 8817-8821 |
| Number of pages | 5 |
| Journal | Journal of Materials Chemistry C |
| Volume | 4 |
| Issue number | 37 |
| DOIs | |
| State | Published - 2016 |
Bibliographical note
Publisher Copyright:© 2016 The Royal Society of Chemistry.
Funding
| Funders | Funder number |
|---|---|
| U.S. Department of Energy Chinese Academy of Sciences Guangzhou Municipal Science and Technology Project Oak Ridge National Laboratory Extreme Science and Engineering Discovery Environment National Science Foundation National Energy Research Scientific Computing Center National Natural Science Foundation of China | 1262261 |
ASJC Scopus subject areas
- General Chemistry
- Materials Chemistry