TY - GEN
T1 - TIM selection for an IGBT cold plate using experimental and numerical modeling
AU - Maddox, John F.
AU - Knight, Roy W.
AU - Bhavnani, Sushil H.
PY - 2013
Y1 - 2013
N2 - Experimental measurements were used in conjunction with a numerical model to perform an in situ analysis of an IGBT cooling solution with a cold plate utilizing an 85-90°C ethylene glycol-water mixture as the cooling fluid. This process was used to aid in the selection of an appropriate thermal interface material (TIM) for the application. The effects of elevated temperature and thermal cycling on the performance of the TIM were investigated during the selection procedure. Applying the thermal grease with the cold plate at 70°C rather than 30°C caused a reduction in the junction to case resistance of 74% and 78% for the two thermal greases tested.
AB - Experimental measurements were used in conjunction with a numerical model to perform an in situ analysis of an IGBT cooling solution with a cold plate utilizing an 85-90°C ethylene glycol-water mixture as the cooling fluid. This process was used to aid in the selection of an appropriate thermal interface material (TIM) for the application. The effects of elevated temperature and thermal cycling on the performance of the TIM were investigated during the selection procedure. Applying the thermal grease with the cold plate at 70°C rather than 30°C caused a reduction in the junction to case resistance of 74% and 78% for the two thermal greases tested.
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U2 - 10.1115/IPACK2013-73207
DO - 10.1115/IPACK2013-73207
M3 - Conference contribution
AN - SCOPUS:84894664967
SN - 9780791855768
T3 - ASME 2013 International Technical Conference and Exhibition on Packaging and Integration of Electronic and Photonic Microsystems, InterPACK 2013
BT - ASME 2013 International Technical Conference and Exhibition on Packaging and Integration of Electronic and Photonic Microsystems, InterPACK 2013
T2 - ASME 2013 International Technical Conference and Exhibition on Packaging and Integration of Electronic and Photonic Microsystems, InterPACK 2013
Y2 - 16 July 2013 through 18 July 2013
ER -