TY - JOUR
T1 - Tunnelling spectroscopy of high‐temperature superconductors
AU - de Lozanne, A. L.
AU - Ng, K. W.
AU - Pan, S.
AU - Silver, R. M.
AU - Berezin, A.
PY - 1988/10
Y1 - 1988/10
N2 - We measured samples of La1·85Sr0·15CuO4‐y and YBa2Cu3O7‐y with a UHV low‐temperature scanning tunnelling microscope using tips made out of tungsten, aluminium and indium. The samples are either sintered pellets, single crystals, or thin films. A wide variety of I‐V curves were obtained ranging from nearly ideal S‐I‐N and S‐I‐S characteristics, to strongly asymmetric and multiple‐peaked characteristics. The best data are obtained with thin film samples and indium tips. Large values of 2δ/kTc (∼ 11) are observed in most cases. We discuss possible explanations for these large values. New data are presented obtained with thin films of Y‐Ba‐Cu‐O made by e‐beam evaporation in our laboratory. A system of loadlocks is used to ensure that these films are never exposed to the atmosphere. 1988 Blackwell Science Ltd
AB - We measured samples of La1·85Sr0·15CuO4‐y and YBa2Cu3O7‐y with a UHV low‐temperature scanning tunnelling microscope using tips made out of tungsten, aluminium and indium. The samples are either sintered pellets, single crystals, or thin films. A wide variety of I‐V curves were obtained ranging from nearly ideal S‐I‐N and S‐I‐S characteristics, to strongly asymmetric and multiple‐peaked characteristics. The best data are obtained with thin film samples and indium tips. Large values of 2δ/kTc (∼ 11) are observed in most cases. We discuss possible explanations for these large values. New data are presented obtained with thin films of Y‐Ba‐Cu‐O made by e‐beam evaporation in our laboratory. A system of loadlocks is used to ensure that these films are never exposed to the atmosphere. 1988 Blackwell Science Ltd
KW - High‐temperature superconductors
KW - STM
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U2 - 10.1111/j.1365-2818.1988.tb01368.x
DO - 10.1111/j.1365-2818.1988.tb01368.x
M3 - Article
AN - SCOPUS:84986684469
SN - 0022-2720
VL - 152
SP - 117
EP - 122
JO - Journal of Microscopy
JF - Journal of Microscopy
IS - 1
ER -