Using SPC and template monitoring method for fault detection and prediction in discrete event manufacturing systems

Hisham Khalil Fadel, Lawrence E. Holloway

Research output: Contribution to conferencePaperpeer-review

23 Scopus citations

Abstract

The behavior of manufacturing systems with discrete I/O signals can be characterized by the timing and sequencing of changes (events) in these I/O. In this paper, we present a method to monitor these signals to alarm when faulty sequencing or timing behavior occurs, and also to warn when the timing starts to deviate from its normal behavior. This is accomplished by using a combination of the time template monitoring technique and statistical process control (SPC).

Original languageEnglish
Pages150-155
Number of pages6
DOIs
StatePublished - 1999
EventProceedings of the 1999 IEEE International Symposium on Intelligent Control - Intelligent Systems and Semiotics - Cambridge, MA, USA
Duration: Sep 15 1999Sep 17 1999

Conference

ConferenceProceedings of the 1999 IEEE International Symposium on Intelligent Control - Intelligent Systems and Semiotics
CityCambridge, MA, USA
Period9/15/999/17/99

ASJC Scopus subject areas

  • Control and Systems Engineering
  • Modeling and Simulation
  • Computer Science Applications
  • Electrical and Electronic Engineering

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