TY - GEN
T1 - Voronoi tessellated halftone masks
AU - Garateguy, G. J.
AU - Arce, G. R.
AU - Lau, D. L.
PY - 2010
Y1 - 2010
N2 - A new algorithm to build blue noise masks using centroidal Voronoi tessellations (CVT) and a variant of Lloyd's Algorithm is presented. The algorithm takes advantage of the optimality properties of CVTs and through a modified version of Lloyd's algorithm, achieves optimization of the stacked binary patterns that build the mask. A new ordering for binary pattern design is presented, as well as a new metric that allows the creation of quality profiles of the masks. The masks generated by this method are used to halftone sample images, and quality profiles are created. It is shown that CVT masks outperform masks created by DBS and VaC according to the new metric defined and thorough visual inspection of halftoned images.
AB - A new algorithm to build blue noise masks using centroidal Voronoi tessellations (CVT) and a variant of Lloyd's Algorithm is presented. The algorithm takes advantage of the optimality properties of CVTs and through a modified version of Lloyd's algorithm, achieves optimization of the stacked binary patterns that build the mask. A new ordering for binary pattern design is presented, as well as a new metric that allows the creation of quality profiles of the masks. The masks generated by this method are used to halftone sample images, and quality profiles are created. It is shown that CVT masks outperform masks created by DBS and VaC according to the new metric defined and thorough visual inspection of halftoned images.
KW - Blue-noise masking
KW - Cell aspect ratio measure
KW - Centroidal Voronoi tessellations
KW - Halftoning
UR - http://www.scopus.com/inward/record.url?scp=78651066201&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=78651066201&partnerID=8YFLogxK
U2 - 10.1109/ICIP.2010.5651703
DO - 10.1109/ICIP.2010.5651703
M3 - Conference contribution
AN - SCOPUS:78651066201
SN - 9781424479948
T3 - Proceedings - International Conference on Image Processing, ICIP
SP - 529
EP - 532
BT - 2010 IEEE International Conference on Image Processing, ICIP 2010 - Proceedings
T2 - 2010 17th IEEE International Conference on Image Processing, ICIP 2010
Y2 - 26 September 2010 through 29 September 2010
ER -