Work function measurements on coated and uncoated tungsten dispenser cathodes using a Kelvin probe

Phillip Swartzentruber; John Balk; James O. Tarter

doi:10.1109/IVEC.2013.6571038

Work function measurements on coated and uncoated tungsten dispenser cathodes using a Kelvin probe

Phillip Swartzentruber, John Balk, James O. Tarter

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

The room temperature work functions of several dispenser cathode configurations under different conditions were evaluated using a Kelvin probe.

Original language	English
Title of host publication	14th IEEE International Vacuum Electronics Conference, IVEC 2013 - Proceedings
DOIs	https://doi.org/10.1109/IVEC.2013.6571038
State	Published - 2013
Event	14th IEEE International Vacuum Electronics Conference, IVEC 2013 - Paris, France Duration: May 21 2013 → May 23 2013

Publication series

Name	14th IEEE International Vacuum Electronics Conference, IVEC 2013 - Proceedings

Conference

Conference	14th IEEE International Vacuum Electronics Conference, IVEC 2013
Country/Territory	France
City	Paris
Period	5/21/13 → 5/23/13

Keywords

Dispenser Cathode
Kelvin Probe
Work Function

ASJC Scopus subject areas

Electrical and Electronic Engineering

Access to Document

10.1109/IVEC.2013.6571038

Cite this

Swartzentruber, P., Balk, J., & Tarter, J. O. (2013). Work function measurements on coated and uncoated tungsten dispenser cathodes using a Kelvin probe. In 14th IEEE International Vacuum Electronics Conference, IVEC 2013 - Proceedings Article 6571038 (14th IEEE International Vacuum Electronics Conference, IVEC 2013 - Proceedings). https://doi.org/10.1109/IVEC.2013.6571038

@inproceedings{2ef361b60f134f34a422bb359bda506b,

title = "Work function measurements on coated and uncoated tungsten dispenser cathodes using a Kelvin probe",

abstract = "The room temperature work functions of several dispenser cathode configurations under different conditions were evaluated using a Kelvin probe.",

keywords = "Dispenser Cathode, Kelvin Probe, Work Function",

author = "Phillip Swartzentruber and John Balk and Tarter, {James O.}",

year = "2013",

doi = "10.1109/IVEC.2013.6571038",

language = "English",

isbn = "9781467359757",

series = "14th IEEE International Vacuum Electronics Conference, IVEC 2013 - Proceedings",

booktitle = "14th IEEE International Vacuum Electronics Conference, IVEC 2013 - Proceedings",

note = "14th IEEE International Vacuum Electronics Conference, IVEC 2013 ; Conference date: 21-05-2013 Through 23-05-2013",

}

Swartzentruber, P, Balk, J & Tarter, JO 2013, Work function measurements on coated and uncoated tungsten dispenser cathodes using a Kelvin probe. in 14th IEEE International Vacuum Electronics Conference, IVEC 2013 - Proceedings., 6571038, 14th IEEE International Vacuum Electronics Conference, IVEC 2013 - Proceedings, 14th IEEE International Vacuum Electronics Conference, IVEC 2013, Paris, France, 5/21/13. https://doi.org/10.1109/IVEC.2013.6571038

Work function measurements on coated and uncoated tungsten dispenser cathodes using a Kelvin probe. / Swartzentruber, Phillip; Balk, John; Tarter, James O.
14th IEEE International Vacuum Electronics Conference, IVEC 2013 - Proceedings. 2013. 6571038 (14th IEEE International Vacuum Electronics Conference, IVEC 2013 - Proceedings).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Work function measurements on coated and uncoated tungsten dispenser cathodes using a Kelvin probe

AU - Swartzentruber, Phillip

AU - Balk, John

AU - Tarter, James O.

PY - 2013

Y1 - 2013

N2 - The room temperature work functions of several dispenser cathode configurations under different conditions were evaluated using a Kelvin probe.

AB - The room temperature work functions of several dispenser cathode configurations under different conditions were evaluated using a Kelvin probe.

KW - Dispenser Cathode

KW - Kelvin Probe

KW - Work Function

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U2 - 10.1109/IVEC.2013.6571038

DO - 10.1109/IVEC.2013.6571038

M3 - Conference contribution

AN - SCOPUS:84883428152

SN - 9781467359757

T3 - 14th IEEE International Vacuum Electronics Conference, IVEC 2013 - Proceedings

BT - 14th IEEE International Vacuum Electronics Conference, IVEC 2013 - Proceedings

T2 - 14th IEEE International Vacuum Electronics Conference, IVEC 2013

Y2 - 21 May 2013 through 23 May 2013

ER -

Work function measurements on coated and uncoated tungsten dispenser cathodes using a Kelvin probe

Abstract

Publication series

Conference

Keywords

ASJC Scopus subject areas

Access to Document

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