X-ray reflectivity study of an amphiphilic hexa-peri-hexabenzocoronene at a structured silicon wafer surface

Stephan Kubowicz; Andreas F. Thünemann; Thomas M. Geue; Ullrich Pietsch; Mark D. Watson; Natalia Tchebotareva; Klaus Müllen

doi:10.1021/la035210e

X-ray reflectivity study of an amphiphilic hexa-peri-hexabenzocoronene at a structured silicon wafer surface

Stephan Kubowicz, Andreas F. Thünemann, Thomas M. Geue, Ullrich Pietsch, Mark D. Watson, Natalia Tchebotareva, Klaus Müllen

Chemistry

Research output: Contribution to journal › Article › peer-review

9 Scopus citations

Abstract

An amphiphilic HBC was transferred via the Langmuir-Blodgett technique homogeneously to a structured silicon wafer. The ordering of the HBC film on the structured wafer is surprisingly high and the same as when HBC was deposited on a smooth wafer.

Original language	English
Pages (from-to)	10997-10999
Number of pages	3
Journal	Langmuir
Volume	19
Issue number	26
DOIs	https://doi.org/10.1021/la035210e
State	Published - Dec 23 2003

ASJC Scopus subject areas

General Materials Science
Condensed Matter Physics
Surfaces and Interfaces
Spectroscopy
Electrochemistry

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10.1021/la035210e

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title = "X-ray reflectivity study of an amphiphilic hexa-peri-hexabenzocoronene at a structured silicon wafer surface",

abstract = "An amphiphilic HBC was transferred via the Langmuir-Blodgett technique homogeneously to a structured silicon wafer. The ordering of the HBC film on the structured wafer is surprisingly high and the same as when HBC was deposited on a smooth wafer.",

author = "Stephan Kubowicz and Th{\"u}nemann, {Andreas F.} and Geue, {Thomas M.} and Ullrich Pietsch and Watson, {Mark D.} and Natalia Tchebotareva and Klaus M{\"u}llen",

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AU - Kubowicz, Stephan

AU - Thünemann, Andreas F.

AU - Geue, Thomas M.

AU - Pietsch, Ullrich

AU - Watson, Mark D.

AU - Tchebotareva, Natalia

AU - Müllen, Klaus

PY - 2003/12/23

Y1 - 2003/12/23

N2 - An amphiphilic HBC was transferred via the Langmuir-Blodgett technique homogeneously to a structured silicon wafer. The ordering of the HBC film on the structured wafer is surprisingly high and the same as when HBC was deposited on a smooth wafer.

AB - An amphiphilic HBC was transferred via the Langmuir-Blodgett technique homogeneously to a structured silicon wafer. The ordering of the HBC film on the structured wafer is surprisingly high and the same as when HBC was deposited on a smooth wafer.

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U2 - 10.1021/la035210e

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JF - Langmuir

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X-ray reflectivity study of an amphiphilic hexa-peri-hexabenzocoronene at a structured silicon wafer surface

Abstract

ASJC Scopus subject areas

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