3D scanning by means of dual-projector structured light illumination

Ying Yu; Daniel L. Lau; Matthew P. Ruffner

doi:10.1117/12.2510990

3D scanning by means of dual-projector structured light illumination

Ying Yu, Daniel L. Lau, Matthew P. Ruffner

Producción científica: Conference contribution › revisión exhaustiva

1 Cita (Scopus)

Resumen

This paper introduces a dual-projector phase measuring profiler that adds a second projector to a traditional structured light illumination system to improve the overall quality of 3D scanning. With this method, two projectors are synchronized to a single camera, but each one projects structured light patterns of a unique frequency. The system performance benefits from a wider projection angle and doubled light intensity. In particular, a detailed system implementation in hardware is described. Moreover, the major difference between the phase unwrapping of our dual-projector system versus a single-projector system is discussed with a LUTbased phase unwrapping scheme proposed.

Idioma original	English
Título de la publicación alojada	Emerging Digital Micromirror Device Based Systems and Applications XI
Editores	Michael R. Douglass, John Ehmke, Benjamin L. Lee
ISBN (versión digital)	9781510625068
DOI	https://doi.org/10.1117/12.2510990
Estado	Published - 2019
Evento	Emerging Digital Micromirror Device Based Systems and Applications XI 2019 - San Francisco, United States Duración: feb 5 2019 → feb 6 2019

Serie de la publicación

Nombre	Proceedings of SPIE - The International Society for Optical Engineering
Volumen	10932
ISSN (versión impresa)	0277-786X
ISSN (versión digital)	1996-756X

Conference

Conference	Emerging Digital Micromirror Device Based Systems and Applications XI 2019
País/Territorio	United States
Ciudad	San Francisco
Período	2/5/19 → 2/6/19

Nota bibliográfica

Publisher Copyright:
© 2019 SPIE.

Financiación

This work has been supported by Intel Corporation and the National Science Foundation under contract No. 1539157 and the Visual and Experiential Computing initiative. Dr. Daniel L. Lau is a Professor at the University of Kentucky and a Founder of Seikowave Inc., a private company that designs and sells structured light scanners.

Financiadores	Número del financiador
National Science Foundation (NSF)	1539157
Intel Corporation

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Computer Science Applications
Applied Mathematics
Electrical and Electronic Engineering

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10.1117/12.2510990

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Yu, Y., Lau, D. L., & Ruffner, M. P. (2019). 3D scanning by means of dual-projector structured light illumination. En M. R. Douglass, J. Ehmke, & B. L. Lee (Eds.), Emerging Digital Micromirror Device Based Systems and Applications XI Artículo 109320M (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 10932). https://doi.org/10.1117/12.2510990

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title = "3D scanning by means of dual-projector structured light illumination",

abstract = "This paper introduces a dual-projector phase measuring profiler that adds a second projector to a traditional structured light illumination system to improve the overall quality of 3D scanning. With this method, two projectors are synchronized to a single camera, but each one projects structured light patterns of a unique frequency. The system performance benefits from a wider projection angle and doubled light intensity. In particular, a detailed system implementation in hardware is described. Moreover, the major difference between the phase unwrapping of our dual-projector system versus a single-projector system is discussed with a LUTbased phase unwrapping scheme proposed.",

keywords = "Dual-projector, Phase measuring profilometry, Phase unwrapping, Structured light illumination",

author = "Ying Yu and Lau, \{Daniel L.\} and Ruffner, \{Matthew P.\}",

note = "Publisher Copyright: {\textcopyright} 2019 SPIE. Copyright: Copyright 2019 Elsevier B.V., All rights reserved.; Emerging Digital Micromirror Device Based Systems and Applications XI 2019 ; Conference date: 05-02-2019 Through 06-02-2019",

year = "2019",

doi = "10.1117/12.2510990",

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Yu, Y, Lau, DL & Ruffner, MP 2019, 3D scanning by means of dual-projector structured light illumination. En MR Douglass, J Ehmke & BL Lee (eds.), Emerging Digital Micromirror Device Based Systems and Applications XI., 109320M, Proceedings of SPIE - The International Society for Optical Engineering, vol. 10932, Emerging Digital Micromirror Device Based Systems and Applications XI 2019, San Francisco, United States, 2/5/19. https://doi.org/10.1117/12.2510990

3D scanning by means of dual-projector structured light illumination. / Yu, Ying; Lau, Daniel L.; Ruffner, Matthew P.
Emerging Digital Micromirror Device Based Systems and Applications XI. ed. / Michael R. Douglass; John Ehmke; Benjamin L. Lee. 2019. 109320M (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 10932).

Producción científica: Conference contribution › revisión exhaustiva

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AB - This paper introduces a dual-projector phase measuring profiler that adds a second projector to a traditional structured light illumination system to improve the overall quality of 3D scanning. With this method, two projectors are synchronized to a single camera, but each one projects structured light patterns of a unique frequency. The system performance benefits from a wider projection angle and doubled light intensity. In particular, a detailed system implementation in hardware is described. Moreover, the major difference between the phase unwrapping of our dual-projector system versus a single-projector system is discussed with a LUTbased phase unwrapping scheme proposed.

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KW - Structured light illumination

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3D scanning by means of dual-projector structured light illumination

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ASJC Scopus subject areas

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