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A mixed phosphine sulfide/selenide structure as an instructional example for how to evaluate the quality of a model

  • Sean Parkin
  • , Jeremy Cunningham
  • , Brian Rawls
  • , John E. Bender
  • , Richard J. Staples
  • , Shannon M. Biros

Producción científica: Articlerevisión exhaustiva

4 Citas (Scopus)

Resumen

This paper compares variations on a structure model derived from an X-ray diffraction data set from a solid solution of chalcogenide derivatives of cis-1,2-bis(diphenylphosphanyl)ethylene, namely, 1,2-(ethene-1,2-diyl)bis(diphenyl-phoshpine sulfide/selenide), C26H22P2S1.13Se0.87. A sequence of processes are presented to ascertain the composition of the crystal, along with strategies for which aspects of the model to inspect to ensure a chemically and crystallographically realistic structure. Criteria include mis-matches between Fobs2 and Fcalc2 , plots of |Fobs| vs |Fcalc|, residual electron density, checkCIF alerts, pitfalls of the OMIT command used to suppress ill-fitting data, comparative size of displacement ellipsoids, and critical inspection of interatomic distances. Since the structure is quite small, solves easily, and presents a number of readily expressible refinement concepts, we feel that it would make a straightforward and concise instructional piece for students learning how to determine if their model provides the best fit for the data and show students how to critically assess their structures.

Idioma originalEnglish
Páginas (desde-hasta)246-253
Número de páginas8
PublicaciónActa Crystallographica Section E: Crystallographic Communications
Volumen79
N.ºPt 4
DOI
EstadoPublished - mar 28 2023

Nota bibliográfica

Publisher Copyright:
© 2023 International Union of Crystallography. All rights reserved.

Financiación

We are grateful to the GVSU Chemistry Department Weldon Fund for support of this work. The CCD-based X-ray diffractometers at Michigan State University were upgraded and/or replaced using departmental funds. We are grateful to the GVSU Chemistry Department Weldon Fund for support of this work. The CCD-based X-ray diffractometers at Michigan State University were upgraded and/or replaced using departmental funds. Funding for this research was provided by: NSF (RUI CHE-2102576) to SB at GVSU) and GVSU CSCE Research Grant-in-Aid to B. Rawls.

FinanciadoresNúmero del financiador
GVSU Chemistry Department Weldon Fund
Grand Valley State University
National Science Foundation Arctic Social Science Program2102576, RUI CHE-2102576

    ASJC Scopus subject areas

    • General Chemistry
    • General Materials Science
    • Condensed Matter Physics

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