Ir directamente a la navegación principal Ir directamente a la búsqueda Ir directamente al contenido principal

A novel method for equipment sensitivity study during power quality events

Producción científica: Conference contributionrevisión exhaustiva

9 Citas (Scopus)

Resumen

This paper presents a new simulation method for performing an equipment sensitivity study during power quality events. Power quality waveform events such as voltage sags, swells, transients, etc. may cause sensitive loads to trip or mis-operate. For better coordination between the system and the equipment, it is necessary that the effects of specific events on the equipment behavior be thoroughly evaluated. This paper serves such a purpose. A library has been designed for generating various types of event waveforms. By imposing these waveforms on the equipment and tuning various waveform features, the equipment behavior can be correlated to specific event parameters. Methods and case studies as well as software implementation issues in the MATLAB environment are illustrated. It is concluded that the proposed approach is flexible and feasible for practical applications.

Idioma originalEnglish
Título de la publicación alojada2000 IEEE Power Engineering Society, Conference Proceedings
Páginas993-998
Número de páginas6
ISBN (versión digital)0780359356, 9780780359352
DOI
EstadoPublished - 2000
EventoIEEE Power Engineering Society Winter Meeting, 2000 - Singapore, Singapore
Duración: ene 23 2000ene 27 2000

Serie de la publicación

Nombre2000 IEEE Power Engineering Society, Conference Proceedings
Volumen2

Conference

ConferenceIEEE Power Engineering Society Winter Meeting, 2000
País/TerritorioSingapore
CiudadSingapore
Período1/23/001/27/00

Nota bibliográfica

Publisher Copyright:
© 2000 IEEE.

ASJC Scopus subject areas

  • Energy Engineering and Power Technology
  • Electrical and Electronic Engineering

Huella

Profundice en los temas de investigación de 'A novel method for equipment sensitivity study during power quality events'. En conjunto forman una huella única.

Citar esto